Session Details

Webinar 1

SIR & ECM Introduction

  • Objectives
  • Why we use standards
  • IPC J-001 strengths and weaknesses
  • “Cleanliness” is grossly misleading, hence its removal
  • Objective Evidence is the replacement
  • Summary

8m 20s

Webinar 2

Electrochemical Reliability and SIR

  • Research conducted by NPL as a pan-European project
  • An explanation of ECM as corrosion
  • A review of Squares
  • Why SIR and the need for a suitable “Measurand”
  • What does Objective Evidence mean?

13m 33s

Webinar 3

ECM Examples

  • ECM types
  • Examples from Bosch, HP and NPL
  • ECM requirements
  • The Technical Report of the RR program
    • IPC paper from Chris January 2017
    • IEC TR 61189-5-506

4m 34s

Webinar 4

Testing Background

  • Why the 1.56µg/cm2 NaCl equivalence was removed
  • Test Options
  • User must decide Characterisation, Verification, Validation or Qualification
  • IPC-TM-650 method 2.6.3.7.1
  • IEC 61189-5-502
  • Test summary

10m 56s

Webinar 5

Materials Testing - Circuit Boards

  • CAF and AMP
  • HV and LV design considerations
  • Issues for consideration

3m 36s


Webinar 6

Materials Testing - Process Materials

  • Paste vs Flux vs Rework
  • Standards limitations
  • Hand soldering/Rework cautions
  • Additional process materials are considered

3m 40s

Webinar 7

SIR Test Coupon Design

  • Materials characterization vs process characterization
  • Influencing factors
  • HV vs LV influences
  • Field strength and voltage gradient
  • Latest round robin test results
  • Design considerations
  • IPC 9201 SIR Test Handbook and Section 3.3.8
  • Coupon examples

8m 52s

Webinar 8

New IEC Standards - A Walk Through

  • Scope
  • Measurement technique
  • The B52 and field gradient
  • Dummy components
  • The test chamber

5m 25s

Webinar 9

SIR Additional Information

  • Number of test coupons
  • Test duration
  • Is SIR good to use for Qualification testing?
  • SIR and Objective Evidence

3m 50s

Webinar 10

Process Ionic Contamination Testing

  • EC 61189-5-504 PICT = ROSE testing revised
  • Method returned to process control as originally intended
  • Critical Factors
  • Test solution temperature and ratio
  • Ratio of solution to surface area
  • Closed Loop vs Open Loop explained
  • Sensitivity and how the method should work
  • Test duration
  • Process control as part of Objective Evidence

7m 09s

Webinar 11

Historical Background

  • IPC and the DoD
  • IEC
  • Summary recommendations and reference materials
  • Concluding comments

6m 56s

Session Details Presenters

Graham Naisbitt

GEN3 President. Current chair of IPC 5-32b SIR/ECM Task Group, vice-chair IPC 5-30 Cleaning & Coating committee and vice-chair IPC 5-32e CAF Task Group. With over 40 years in the electronics industry, Graham has been involved in helping develop and introduce many test standards in ISO, IEC and IPC. GEN3 was founded in 1979 as Concoat until its acquisition by Chase Corporation, HumiSeal Division in 2005.

Dr. Chris Hunt

GEN3 CTO, was formerly with NPL and head of the Electronics Interconnect division. Chris led research into SIR, CAF, Solderability and much more. He helped industry deal with cleaning alternatives to CFC’s and the introduction and use of lead-free alloys. Chris was past chairman of IEC TC91.

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