Predicting Reliability in Electronics
More Information Webinar Background
This webinar series takes the viewer through the history of the influences of Electro-chemical Migration (ECM) and the evolving use of Surface Insulation Resistance Testing
(SIR) that has been developed over the past 25 years by GEN3 and its association with the British National Physical Laboratory. (NPL - www.npl.co.uk/).
Together, GEN3 and NPL have created the standard that has now been in widespread use around the world since the turn of the millennium.
It was only in 2017 that, together with our customer, Robert Bosch, we were able to demonstrate the insufficiency that has been the ROSE test accept/reject of 1.56 µg/cm2 NaCl equivalence, unchanged since the mid-1970’s.
GEN3 “wrote the book” on the subject and have played a major part in the creation of four ground-breaking test standards published between 2019 and 2021 that set the scene for “Objective Evidence” and its widespread influence throughout the world of electronics, whether in the high reliability arena of Space, Medical, Automotive or general Industrial applications.
GEN3 are manufacturers of measurement instruments including AutoSIR®, AutoCAF®, CM Series-Contaminometer®, the world’s only combined ROSE and PICT closed-loop tester that has unique 6 Sigma verification.
Session Details
Process Ionic Contamination Testing
- EC 61189-5-504 PICT = ROSE testing revised
- Method returned to process control as originally intended
- Critical Factors
- Test solution temperature and ratio
- Ratio of solution to surface area
- Closed Loop vs Open Loop explained
- Sensitivity and how the method should work
- Test duration
- Process control as part of Objective Evidence
7m 09s
Session Details Presenters
Graham Naisbitt
GEN3 President. Current chair of IPC 5-32b SIR/ECM Task Group, vice-chair IPC 5-30 Cleaning & Coating committee and vice-chair IPC 5-32e CAF Task Group. With over 40 years in the electronics industry, Graham has been involved in helping develop and introduce many test standards in ISO, IEC and IPC. GEN3 was founded in 1979 as Concoat until its acquisition by Chase Corporation, HumiSeal Division in 2005.
Dr. Chris Hunt
GEN3 CTO, was formerly with NPL and head of the Electronics Interconnect division. Chris led research into SIR, CAF, Solderability and much more. He helped industry deal with cleaning alternatives to CFC’s and the introduction and use of lead-free alloys. Chris was past chairman of IEC TC91.
Additional Resource
Free eBook Download
