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The Printed Circuit Assembler’s Guide to... ™
Design for Test: A Practical Guide to Test and Inspection

by: Bert Horner

The Printed Circuit Assembler’s Guide to... Design for Test presents a practical roadmap for integrating DFT into PCB and CCA development, emphasizing early test strategy—during schematic capture and layout—rather than adding it after design completion. It explains how the complexity of modern electronics, shrinking geometries, and high-density packaging demand smarter access strategies, including boundary scan, BIST, flying probe, ICT, and functional testing. Central to the book is the PCOLA-SOQ framework, which provides a structured, measurable method for evaluating inspection and test coverage at both component and pin levels. The author highlights the cultural shift required to make DFT a shared responsibility across engineering, manufacturing, quality, and leadership teams. By combining layered test strategies with measurable coverage metrics, organizations can improve first-pass yield, reduce rework and field failures, strengthen compliance, and accelerate time to market while building long-term product reliability and confidence.



ISBN: 978-1-959894-49-0

Bert Horner is a seasoned electronics test engineering professional with over three decades of experience specializing in in-circuit testing (ICT), flying probe testing, boundary scan, and functional test development. Beginning his career at The Test Connection, Inc. (TTCI) under the mentorship of his father, Bill, he has progressed through roles as technician, test engineer, and applications leader to his current role as president.

Under Horner’s leadership, TTCI has earned a reputation for delivering high-quality test solutions across critical industries, including aerospace, defense, medical, and automotive. The company is ISO 9001:2015 certified and ITAR registered, with a strong focus on test coverage, accuracy, and efficiency.

Horner also founded The Training Connection LLC (TTC-LLC), a dedicated training center focused on developing workforce skills in test engineering, Design for Test (DFT), and IPC and SMTA-recognized quality and soldering standards.

An active member of the Global Electronics Association, PCEA (Printed Circuit Engineering Association), and PCBAA (Printed Circuit Board Association of America), Horner continues to advocate for U.S. electronics manufacturing and workforce development. He also serves as an advisor and former president of the SMTA Capital Chapter, working closely with local and national organizations to strengthen technical education and industry collaboration. Outside of work, Horner enjoys cheering on his daughter at equestrian competitions, supporting his son’s 3D printing innovations, and spending time with his wife, Monica. Outside of work, Bert enjoys cheering on his daughter at equestrian competitions, supporting his son’s 3D printing innovations, and spending time with his wife, Monica.

The Test Connection, Inc. (TTCI), headquartered in Hunt Valley, Maryland, is an ITAR-registered and ISO 9001-certified electronics test engineering firm founded in 1980. As one of the longest-standing test-focused companies in the industry, TTCI brings over a century of combined expertise to support customers from early Design for Test (DFT) evaluations through high-volume production testing.

TTCI provides a full suite of test solutions, including flying probe, in-circuit (ICT), boundary scan, and functional test services. Their test platforms include Seica Pilot V8, Digitaltest MTS-500, Keysight (Agilent) 3070, Teradyne TestStation, and XJTAG boundary scan. TTCI also supports advanced tools like Aster Technologies' TestWay Express, Feasa LED Analyser, and SMH FlashRunner programmers.

TTCI is active in leading industry groups such as Global Electronics Association, SMTA, PCEBAA, and PCBEA. The company recently launched The Training Connection to strengthen workforce development and promote test engineering education across the electronics

This book has been technically reviewed by the following experts:

Williiam E. Webb Technical Director, Aster Technologies

Will Webb has worked in the manufacturing test industry for over 26 years and is employed by ASTER Technologies as the technical director of the ASTER USA office. Aster has been with the company for the past 10 years and is responsible for new business development and sales of the ASTER Suite of Dfx [...]

Tamara Jovanovic Electronics Engineer, Masimo

Tamara Jovanovic began her career as an electrical engineer at Happiest Baby, Inc., where she designed and developed smart products that promote safe sleep for newborns. Her work combined hardware development with user-focused design, giving her valuable experience in creating connected devices from [...]

Chapter Summaries

  • Chapter 1

    The Importance of Test and Inspection in CCA and PCB Design

    This chapter explains why test strategy must evolve alongside modern PCB complexity. The author explores ownership of test planning, manufacturing challenges, and the risks of neglecting testability.

  • Chapter 2

    The Rules for Design for Test (DFT)

    Practical DFT rules covering test access, test point placement, boundary scan, BIST, electrical and mechanical considerations, and documentation.

  • Chapter 3

    The Benefits of DFT

    This chapter details measurable advantages of DFT, including faster troubleshooting, improved first-pass yield, reduced rework, better equipment utilization, enhanced compliance, and scalable automation.

  • Chapter 4

    Implementing DFT Into the Process

    Chapter 4 focuses on cultural transformation, how to embed DFT into organizational workflows, simulation tools, cross-disciplinary collaboration, and more. The chapter highlights continuous improvement.

  • Chapter 5

    What Does It All Mean? How to Be Successful

    This chapter offers actionable guidance for sustaining a test-first culture, fostering collaboration, leveraging PCOLA-SOQ, and aligning leadership support to ensure consistent, scalable, quality-driven test strategies.

  • Chapter 6

    Measuring Effectiveness with PCOLA-SOQ

    Here, the author explores PCOLA-SOQ in depth. Readers will discover how to map AOI, AXI, ICT, FPT, boundary scan, and functional test to coverage goals.

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Contact the Author

For technical support click here

Williiam E. Webb Will Webb has worked in the manufacturing test industry for over 26 years and is employed by ASTER Technologies as the technical director of the ASTER USA office. Aster has been with the company for the past 10 years and is responsible for new business development and sales of the ASTER Suite of Dfx products, including ‘TestWay’ for DFT and Test Coverage Analysis, technical support, and product enhancement. Prior to joining ASTER Technologies, Aster worked for several OEMs and CMs in the manufacturing test field, with responsibilities for DFT analysis, test coverage analysis and measurement, test development, and the overseas deployment of manufacturing tests, including in-circuit test and boundary scan.

Tamara Jovanovic Tamara Jovanovic began her career as an electrical engineer at Happiest Baby, Inc., where she designed and developed smart products that promote safe sleep for newborns. Her work combined hardware development with user-focused design, giving her valuable experience in creating connected devices from concept to production. After several years in consumer tech, Jovanovic moved into the MedTech industry by joining Masimo’s Instrument Hardware team. At Masimo, she helps design and develop advanced patient monitoring devices, working closely with cross-functional teams to ensure high performance, safety, and reliability of these products. Jovanovic’s background includes circuit design, hardware validation, and system integration. She is passionate about using engineering to solve problems and creating technology that improves people’s lives.