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I-Connect007 Editor’s Choice: Five Must-Reads for the Week

July 23, 2026 | Marcy LaRont, I-Connect007

In this week’s top five must-reads, I chose articles that go from big business questions (to diversify or not), to important technical issues such as DFM errors made in creating HDI designs using ELIC and design for test, to a discussion around some of the power and thermal considerations in advanced packaging, and the fact that they are now, firmly, performance enablers, not after-the-fact elements to be managed in fabrication.

I-Connect007 is pleased to announce the release of Episode 7 of the “Meet the Author” podcast, featuring Bert Horner, president of TTCI, discussing his new book, The Printed Circuit Assembler's Guide to... Design for Test. In this conversation with Nolan Johnson, Horner explores what he calls the "Butterfly Effect" of Design for Test (DFT): Decisions made early in the design process can significantly influence manufacturing success, product reliability, and long-term profitability.




MORE ARTICLES
COLUMNS:

As data rates climb from 112G PAM4 toward 224G PAM4 and beyond, electronics designers are discovering that traditional stripline and microstrip geometries are no longer sufficient. The physics simply break. Rise times are now in the...

The electronics industry has experienced a renaissance in semiconductor package technology, driven by the need to maximize electronic product functionality while minimizing the area reserved for component mounting and interconnects....

Elementary, Mr. Watson: Builders of the Dream

July 2, 2026 | John Watson, Elementary, Mr. Watson

In 1849, French writer, journalist, and satirist Jean-Baptiste Alphonse Karr wrote the famous line, “Plus ça change, plus c’est la même chose,” which translates as “The more things change, the more they stay the same.” He...

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