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iNEMI Webinar: Visual Inspection Criteria for Expanded Beam Connectors
May 17, 2019 | iNEMIEstimated reading time: Less than a minute
Expanded beam connectors can reduce the impact of contamination on connector loss compared to fiber-based physical contact connectors due to the increased lens surface area compared to the fiber core. However, the technology does not completely eliminate these additional losses. To date, no formal inspection criteria for allowed lens defects, including contamination, have been adopted by the industry for any expanded beam connectors.
Phases 1 and 2 of iNEMI’s Development of Cleanliness Specification for Expanded Beam Connectors project developed a unique approach for visual inspection criteria for cleanliness on multimode expanded beam connectors. iNEMI is now organizing a third phase to develop visual inspection criteria for single-mode expanded beam connectors.
In line with this, iNEMI is inviting the industry to join the call-for-participation webinar to review plans and objectives for Phase 3 of this important project. Two webinar sessions are scheduled, and are open to members and non-members:
- Session 1: The Americas / Europe: May 31, 11:00 a.m. EDT (US)/17:00 CEST (Europe). Click here to register for this session.
- Session 2: Asia Pacific: June 6, 11:00 a.m. CST (China)/12:00 p.m. JST (Japan). Click here to register for this session.
Suggested Items
Digitalisation and ESG
04/19/2024 | Marina Hornasek-Metzl, AT&SDigitalisation and ESG are prominent and high-priority topics in the global business community. The first focuses on applying technology throughout the value chain to produce faster, smarter, and more desirable business outcomes. The latter emphasises the broader value a business is expected to create for its stakeholders from an environmental, social, and governance perspective.
Real Time with... IPC APEX EXPO 2024: Looking Back, Looking Forward With IEC
04/19/2024 | Real Time with...IPC APEX EXPOIEC came to the RTW booth and discussed both the legacy of IEC's past and the vision for its future. Industry veteran Bruno Ferri highlighted his quarter-century tenure in the industry and with IEC since its founding. He still exhibits boundless enthusiasm for the industry. Brando Stone, a young professional and a future face of IEC, talked about IEC's plans going forward and his experience at this year's IPC APEX EXPO.
Seeking Employment: Meet Parker Capers
04/18/2024 | Barry Matties, I-Connect007Parker Capers, a cybersecurity professional with a decade of experience in the SMT industry, earned a bachelor’s degree from DeVry and is CompTIA Security Plus certified. He is open to various industries but has a strong affinity for manufacturing due to extensive familiarity. Parker appreciates smaller companies where personal connections matter. Are you hiring?
SEMI Applauds CHIPS Program Office Progress to Diversify U.S. Semiconductor Industry Workforce
04/18/2024 | SEMIThe SEMI Foundation, the arm of SEMI dedicated to supporting economic opportunity for workers and the sustained growth of the microelectronics industry by creating pathways and opportunities for job seekers, applauded strides made by the CHIPS Program Office to diversify the U.S. semiconductor industry workforce and its release of the First Annual Report Regarding the Opportunities and Inclusion Activities Undertaken by the Department of Commerce.
VDMA: Machine Vision Navigating Through Uncertain Times
04/18/2024 | VDMAFor over a decade, the European machine vision industry has reported steady growth, with turnover increasing by an average of 9 percent annually between 2012 and 2022. Despite a temporary setback in 2020 (minus 4 percent) due to the Covid-19 pandemic, the industry rebounded strongly in 2021 (plus 17 percent) and 2022 (plus 11 percent).