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Beyond Design: Radiation and Interference Coupling

05/21/2025 | Barry Olney -- Column: Beyond Design
Radiation and interference coupling pose significant challenges to the performance and reliability of high-speed digital designs. Whether it's the unintended emission of electromagnetic waves or the interaction of signals between adjacent circuits, these phenomena can lead to unwanted noise, signal distortion, and even system malfunctions. Understanding the mechanisms behind radiation and interference coupling is crucial for electronics designers seeking to design robust and efficient systems.

NEXT Semiconductor Technologies Collaborates with BAE Systems to Develop Next Generation Space-Qualified Chips

04/28/2025 | PRNewswire
NEXT Semiconductor Technologies is collaborating with BAE Systems to accelerate the insertion of its latest ultra-wideband antenna processor units (APUs) into high-performing radiation-hardened electronic subsystems to support future space missions.

Microchip Completes Radiation-Hardened Power MOSFET Family to MIL-PRF-19500/746 and Achieves JANSF 300 Krad Capability

04/22/2025 | Microchip
The JANS qualification represents the highest level of screening and acceptance requirements, ensuring the superior performance, quality and reliability of discrete semiconductors for aerospace, defense and spaceflight applications.

EdgeCortix SAKURA-I AI Accelerator Demonstrates Robust Radiation Resilience, Suitable for Many Orbital and Lunar Expeditions

01/29/2025 | EdgeCortix
EdgeCortix® Inc., a leading fabless semiconductor company specializing in energy-efficient Artificial Intelligence (AI) processing at the edge, announced that its SAKURA-I AI Accelerator is suitable for space missions including in Earth orbit and on the lunar surface, demonstrating high levels of radiation resiliency.

Spirit Electronics Adds Zero-Error Systems to Provide Ultra-High Reliability Protection from Radiation in Space Applications

10/25/2024 | Spirit Electronics
Spirit Electronics announces franchised distribution for Zero-Error Systems (ZES) to support ultra-high reliability semiconductors and ICs operating in challenging radiation environments. 
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