Multi-Parameter Microscopy Aids Design of Improved Optoelectronic Devices
March 24, 2017 | National Physical LaboratoryEstimated reading time: 1 minute
The National Physical Laboratory (NPL) has developed a novel measurement method, providing simultaneous topographical, electrical, chemical and optical microscopy (STEOM) at the nanoscale for the first time. The new method can be used to optimise the performance of optoelectronic devices such as organic solar cells, sensors and transistors.
The STEOM apparatus for multi-parameter characterisation of optoelectronic devices at the nanoscale
As part of an international collaboration, NPL researchers demonstrated the direct application of the new method to the optimisation of organic solar cells. Transparent, flexible and low-cost organic solar cells could offer a solution to large-scale, low-carbon energy generation. However, a lack of analytical techniques that can simultaneously probe device properties at the nanoscale has presented a major obstacle to their optimisation.
The new STEOM method developed at NPL addresses this problem, providing simultaneous measurements of topography and electrical, chemical and optical properties, while also being non-destructive, causing no damage to the samples being measured. The breakthrough was achieved by combining plasmonic optical signal enhancement with electrical-mode scanning probe microscopy. This allows the relationship between surface morphology, chemical composition and current generation in operating organic solar cells to be explored at the nanoscale for the first time.
The team demonstrated that information gained using the method can successfully explain the performance of organic solar cells in terms of the nanoscale composition of their active surface layer, and could be used to identify the best routes for device optimisation. In addition to organic solar cells, the method can be applied to a range of different problems where nanoscale electronic properties are influenced by surface composition and could consequently be used to guide the design of improved optoelectronic devices, from sensors to LEDs.
Suggested Items
Physicists Create Optical Component for 6G
05/20/2024 | SkoltechA joint team of physicists from Skoltech, MIPT, and ITMO developed an optical component that helps manage the properties of a terahertz beam and split it into several channels.
High Density Packaging User Group Announces Shenzhen Kinwong Electronic Co., Ltd. Membership
05/20/2024 | High Density Packaging User GroupHigh Density Packaging User Group (HDP) is pleased to announce that Shenzhen Kinwong Electronic Co., Ltd. (Kinwong) has become a member.
Real Time with… IPC APEX EXPO 2024: Precision Tools and Problem-solving With Perfect Point
05/14/2024 | Real Time with...IPC APEX EXPOIn an interview with Guest Editor Dan Beaulieu, Alex Girardot, a field applications engineer with Perfect Point, shares his experiences with precision tooling. Alex also discusses a challenging project involving thick boards and small diameter holes in which Carbonite tools with a hybrid design were used. They also discuss the trend toward smaller hole sizes.
epoxySet Launches EC-1015HP - High Temperature, Crack Resistant Epoxy Potting
05/13/2024 | epoxySetepoxySet introduces the EC-1015HP epoxy potting compound. This heat cure system is designed for temperature cycling from -55 to 180°C with significantly better crack resistance than traditional rigid epoxies. As a low viscosity encapsulant, it is used for large and small potting applications with fragile components.
D Coupon Testing and Data Insights With GreenSource Fabrication
04/17/2024 | Marcy LaRont, PCB007 MagazineMarcy LaRont spoke with Steve Karas of GreenSource Fabrication at the SMTA UHDI conference in March. He presented a case study that GreenSource undertook with a customer on critical via reliability with advanced materials and used the experience to highlight the importance and effectiveness of D coupon testing. He also discussed GreenSource’s approach to data aggregation and a new system they developed to use collected data effectively.