Dan’s Biz Bookshelf: ‘Elevate: Push Beyond Your Limits'
The Marketing Minute: The First Step to More Sales—Marketing
It’s Only Common Sense: Customer Service Is Sales in Disguise
Corelis Introduces New ScanExpress Version 9.6.0 Boundary-Scan Software Suite
April 23, 2020 | Corelis, Inc.Estimated reading time: 1 minute
Corelis, the leading supplier of high-performance boundary-scan test and measurement software and hardware, announced today version 9.6.0 of its ScanExpress™ Boundary-Scan Suite of Software is now available.
Improvements include:
ScanExpress Runner Analytics
ScanExpress Runner includes a new analytics feature. Test plan analytic data may be saved to a local database, exported to a file, or viewed using an included chart builder interface. Data collection can be enabled through the ScanExpress Runner GUI. Features include:
- Integrated test plan data collection including individual test execution time, test plan information, individual test step results and diagnostics, and more.
- Data filtering and export for integration with other data systems.
- Chart generation, display, and export.
Boundary-scan Dual and Quad SPI In-System Programming
ScanExpress software now supports dual and Quad SPI programming with boundary-scan. Using dual and quad mode significantly decreases program and verify time with SPI flash devices. New flash device models are required for dual and quad mode operation; customers with a current maintenance contract can contact support@corelis.com with flash part number information for new models.
Other ScanExpress Feature Enhancements
The ScanExpress suite of software has been updated with the latest improvements and fixes. Featured enhancements include:
- ScanExpress JET flash programming operations now include Persistent Protection Bit (PPB) support for Cypress flash devices. PPB support allows more options for protecting and unprotection flash data prior to and after erase, program, and verify operations.
- The ScanExpress Runner application now has the option to tri-state the JTAG controller parallel IO pins after test plan execution. This new feature provides greater support of integration with other test systems; for example, functional tests that also use the JTAG pins can be executed immediately after boundary-scan tests without disconnecting the JTAG controller.
- A new VB.NET example project for the ScanExpress Debugger application programming interface (API) is included. This example can be used with the latest Microsoft Visual Studio to integrate ScanExpress Debugger with VB.NET applications.
Existing Corelis customers with a valid maintenance contract can now access the new software through the Corelis support website. To inquire about a maintenance package or to obtain a full list of improvements, please contact the Corelis Sales team at (562) 926-6727; or, send an email to Sales@corelis.com.
Share on:
Suggested Items
TRI to Exhibit at SMTA Queretaro Expo 2025
07/16/2025 | TRITest Research, Inc. (TRI), the leading provider of test and inspection systems for the electronics manufacturing industry, is pleased to announce plans to exhibit at the SMTA Querétaro Expo 2025, scheduled to take place on July 24, 2025, at the Querétaro Centro de Congresos y Teatro Metropolitano.
Knocking Down the Bone Pile: Addressing End-of-life Component Solderability Issues, Part 4
07/16/2025 | Nash Bell -- Column: Knocking Down the Bone PileIn 1983, the Department of Defense identified that over 40% of military electronic system failures in the field were electrical, with approximately 50% attributed to poor solder connections. Investigations revealed that plated finishes, typically nickel or tin, were porous and non-intermetallic.
Meet the Author Podcast: Martyn Gaudion Unpacks the Secrets of High-Speed PCB Design
07/16/2025 | I-Connect007In this special Meet the Author episode of the On the Line with… podcast, Nolan Johnson sits down with Martyn Gaudion, signal integrity expert, managing director of Polar Instruments, and three-time author in I-Connect007’s popular The Printed Circuit Designer’s Guide to... series.
TTCI Joins Printed Circuit Engineering Association to Strengthen Design-to-Test Collaboration and Workforce Development
07/09/2025 | The Test Connection Inc.The Test Connection Inc. (TTCI), a leading provider of electronic test and manufacturing solutions, is proud to announce its membership in the Printed Circuit Engineering Association (PCEA), further expanding the company’s efforts to support cross-functional collaboration, industry standards, and technical education in the printed circuit design and manufacturing community.
Study on Resonance Mitigation in Metallic Shielding for Integrated Circuits
07/08/2025 | Maria Cuesta-Martin, Victor Martinez, Vidal Gonzalez Aguado, Würth ElektronikInherent cavity resonant modes often lead to significant degradation of shielding effectiveness, responsible for unwanted electromagnetic coupling. Cavity resonant modes of the metal shielding enclosure can produce two adverse problems: the mutual coupling among different RF modules and shielding effectiveness reduction of the metal enclosure. The cabinets serve to shield certain components from electromagnetic interference (EMI). However, these cavities present some resonance peaks at 5 GHz, making it impossible to use them at higher frequencies.