Share on:

Share on LinkedIn Share on X Share on Facebook Share with email

Suggested Items

Happy’s Tech Talk #38: Novel Metallization for UHDI

05/07/2025 | Happy Holden -- Column: Happy’s Tech Talk
I have been involved in high-density electronics substrates since 1970 when I joined Hewlett-Packard’s RF semiconductor group after college. Figure 1 shows the difference between trace/space lithography for substrates and silicon starting in 1970. My projects involved sapphire circuits for RF devices, but the figure displays the state of PCBs and integrated CMOS circuits and their packaging, not discreet RF devices. Even then, semiconductors were 50X higher density.

New Database of Materials Accelerates Electronics Innovation

05/05/2025 | ACN Newswire
In a collaboration between Murata Manufacturing Co., Ltd., and the National Institute for Materials Science (NIMS), researchers have built a comprehensive new database of dielectric material properties curated from thousands of scientific papers.

New Database of Materials Accelerates Electronics Innovation

05/02/2025 | ACN Newswire
In a collaboration between Murata Manufacturing Co., Ltd., and the National Institute for Materials Science (NIMS), researchers have built a comprehensive new database of dielectric material properties curated from thousands of scientific papers.

Micron Announces Business Unit Reorganization to Capitalize on AI Growth Across All Market Segments

04/23/2025 | Micron
Micron Technology, Inc., a leader in innovative memory and storage solutions, announced a market segment-based reorganization of its business units to capitalize on the transformative growth driven by AI, from data centers to edge devices.

Connected Commercial Drone Market to Reach $37.3 Billion Worldwide by 2029

04/04/2025 | Berg Insight
Berg Insight, a leading IoT market research provider, today released a new report covering connected commercial drones used for industrial and governmental purposes.
Copyright © 2025 I-Connect007 | IPC Publishing Group Inc. All rights reserved. Log in