Trouble in Your Tank: Organic Addition Agents in Electrolytic Copper Plating
It’s Only Common Sense: Selling During an Economic Downturn
Marcy’s Musings: Can You Hear the Voices?
Corelis Introduces New ScanExpress Version 9.6.0 Boundary-Scan Software Suite
April 23, 2020 | Corelis, Inc.Estimated reading time: 1 minute
Corelis, the leading supplier of high-performance boundary-scan test and measurement software and hardware, announced today version 9.6.0 of its ScanExpress™ Boundary-Scan Suite of Software is now available.
Improvements include:
ScanExpress Runner Analytics
ScanExpress Runner includes a new analytics feature. Test plan analytic data may be saved to a local database, exported to a file, or viewed using an included chart builder interface. Data collection can be enabled through the ScanExpress Runner GUI. Features include:
- Integrated test plan data collection including individual test execution time, test plan information, individual test step results and diagnostics, and more.
- Data filtering and export for integration with other data systems.
- Chart generation, display, and export.
Boundary-scan Dual and Quad SPI In-System Programming
ScanExpress software now supports dual and Quad SPI programming with boundary-scan. Using dual and quad mode significantly decreases program and verify time with SPI flash devices. New flash device models are required for dual and quad mode operation; customers with a current maintenance contract can contact support@corelis.com with flash part number information for new models.
Other ScanExpress Feature Enhancements
The ScanExpress suite of software has been updated with the latest improvements and fixes. Featured enhancements include:
- ScanExpress JET flash programming operations now include Persistent Protection Bit (PPB) support for Cypress flash devices. PPB support allows more options for protecting and unprotection flash data prior to and after erase, program, and verify operations.
- The ScanExpress Runner application now has the option to tri-state the JTAG controller parallel IO pins after test plan execution. This new feature provides greater support of integration with other test systems; for example, functional tests that also use the JTAG pins can be executed immediately after boundary-scan tests without disconnecting the JTAG controller.
- A new VB.NET example project for the ScanExpress Debugger application programming interface (API) is included. This example can be used with the latest Microsoft Visual Studio to integrate ScanExpress Debugger with VB.NET applications.
Existing Corelis customers with a valid maintenance contract can now access the new software through the Corelis support website. To inquire about a maintenance package or to obtain a full list of improvements, please contact the Corelis Sales team at (562) 926-6727; or, send an email to Sales@corelis.com.
Share on:
Suggested Items
Yamaha Boosts YRi-V AOI Productivity with 3D Component Update
04/22/2025 | Yamaha RoboticsYamaha Robotics Europe SMT Section has introduced instantaneous 3D component update, included with the latest software release for YRi-V automatic optical inspection (AOI) systems, letting users optimise inspection programs without stopping production.
NASA Aims to Fly First Quantum Sensor for Gravity Measurements
04/18/2025 | NASAA lumpy, colorful 3D model of the Earth against a black background, illustrating variations in gravity. North and South America are visible. Red areas show higher gravity, blue areas show lower gravity.
Real Time with... IPC APEX EXPO 2025: Aster–Enhancing Design for Effective Testing Strategies
04/18/2025 | Real Time with...IPC APEX EXPOWill Webb, technical director at Aster, stresses the importance of testability in design, emphasizing early engagement to identify testing issues. This discussion covers the integration of testing with Industry 4.0, the need for good test coverage, and adherence to industry standards. Innovations like boundary scan testing and new tools for cluster testing are introduced, highlighting advancements in optimizing testing workflows and collaboration with other tools.
Saki America, Appoints Mario Ramírez Galindo as Project Engineer in Mexico
04/17/2025 | Saki America,Saki America, Inc., an innovator in the field of automated optical and X-ray inspection equipment, is pleased to announce the appointment of Mario Ramírez Galindo as Project Engineer in Mexico. In this role, Mario will support Saki’s customers by providing technical expertise, process optimization, and project management to enhance manufacturing efficiency and inspection accuracy.
New High Power 3D AXI for Power Electronics from Test Research, Inc.
04/17/2025 | TRITest Research, Inc. (TRI), a leading provider of Test and Inspection solutions for the electronics manufacturing industry, proudly announces the launch of the 3D AXI TR7600HP system. Designed for power semiconductor inspection, the TR7600HP enhances accuracy and efficiency in detecting defects in components such as IGBTs, MOSFETs, SiC inverters, and Paladin Connectors.