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JEOL Ltd. announces the release of a new scanning electron microscope (SEM), the JSM-IT700HR for unprecedentedly high throughput in August 2020.
Development background
Scanning electron microscopes are used in various fields, such as nanotechnology, metals, semiconductors, ceramics, medicine, and biology. In addition, SEM applications are expanding to include quality control as well as basic research. The demands are increasing for faster data acquisition of higher-quality SEM images and for easier confirmation of compositional information.
Based on our award-winning predecessor of “InTouchScope™” series SEMs, the JSM-IT700HR is equipped with our in-lens Schottky field emission electron gun (FEG). This new powerful SEM satisfies the needs for observation and analysis of further miniaturized materials in daily laboratory operation.
The JSM-IT700HR delivers a high resolution of 1 nm and a maximum probe current of 300 nA (15 times higher than previously), providing a wealth of observation and analysis information. A simple-to-operate user interface, the compact design accommodating a large specimen chamber, with a renewed anti-vibrational support for the main console achieve more comfortable observation and analysis than before.
For enhancing “Simple operation,” the JSM-IT700HR incorporates a new function, integrated into the SEM GUI, to display the characteristic X-ray generation depth. This supports prompt understanding of the analysis depth (reference) for the specimen, which is useful for elemental analysis.
2 configurations are available, 1) JSM-IT700HR/LV for high and low vacuum image observation, 2) JSM-IT700HR/LA with additional integrated JEOL EDS system.
