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Cirexx International Inc. Chooses atg A9 Flying Probe Technology for High-speed Electrical Test
September 19, 2024 | atg Luther & Maelzer GmbHEstimated reading time: Less than a minute
atg Luther & Maelzer GmbH confirms delivery of high-speed bare board testing technology to PCB fabricator, Cirexx International Inc., in Santa Clara, CA.
Consistent with the on-going investment in leading edge technologies at Cirexx International Inc., the A9 8 head, double-sided, high speed, high accuracy flying probe test system represents the newest addition to Cirexx’s test department. The latest atg technology enables Cirexx to test the most advanced ultra-fine designs while helping to reach industry leading throughput goals.
atg’s A9 can test pad sizes down to 35 micron and is capable of testing products up to a size of 21” x 24”. The A9 eliminates limitations due to test point density or fine-pitch contacts and features embedded component test, 4-wire Kelvin measurement capability with an accuracy of +/- 0,025 mΩ, HPOT and latent testing, all in combination with a test speed of up to 230 measurements/second.
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Indie Semiconductor Extends Automotive Photonics Leadership with Advanced Optical Component Integration Capabilities
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GEN3 Announces Exclusive UK Distribution Partnership with RAS for HATS2 Test System
11/19/2024 | Gen3GEN3, a leading British manufacturer of specialised test, measurement & production equipment for the electronics industry, is pleased to announce its partnership with Reliability Assessment Solutions Inc. (RAS), a leader in advanced reliability testing solutions.
L3Harris Delivers Optical System to NASA for Nancy Grace Roman Space Telescope
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