Keysight Unveils 3kV High Voltage Wafer Test System for Power Semiconductors
October 10, 2024 | BUSINESS WIREEstimated reading time: 1 minute

Keysight Technologies, Inc. introduces a 4881HV High Voltage Wafer Test System expanding its semiconductor test portfolio. The solution improves the productivity of power semiconductor manufacturers by enabling parametric tests up to 3kV supporting high and low-voltage in one-pass test.
Manufacturers have traditionally measured wafers using separate testers for high and low voltages. However, demand for power semiconductors is rapidly growing due to their multifunctionality, higher performance, and next-generation devices such as silicon carbide (SiC) and gallium nitride (GaN). As a result, customers need a solution to more accurately and efficiently test their devices and reduce time to market.
Keysight’s solution addresses these challenges by allowing power device makers to perform process control monitoring (PCM) and wafer acceptance testing (WAT) in manufacturing. The new test system delivers the following benefits:
High-Voltage Capability to Meet Future Needs: The high-voltage switching matrix (HV-SWM) supports up to 3kV requirements, is scalable up to 29 pins, and integrates with precision source measure units (SMUs). It enables highly flexible measurements from low current down to sub-pA resolution up to 3kV at any pins. Additionally, high-voltage capacitance measurement and various parametric tests are supported.
One-pass Testing Increases Productivity and Efficiency: The HV-SWM enables a single test system instead of separate high-voltage and low-voltage test systems. Utilizing one system is more efficient and reduces the required footprint and testing time. The system integrates with factory automation environments using Keysight’s SPECS-FA software, which improves the efficiency of the entire production process.
Enhanced Safety and Reliability: The test system has built-in protection circuitry and machine control, ensuring operators and equipment are not impacted by high-voltage surges during a test, and is compliant with safety regulations, including SEMI S2 standards.
Shinji Terasawa, Vice President and General Manager of Keysight's Wafer Test Solutions, said: “Keysight is thrilled to introduce our new wafer test system for power semiconductors, building on our long tenure of testing advanced semiconductors. Our mission is to lead the market by providing cutting-edge solutions that anticipate and meet the rapidly evolving needs of the semiconductor sector. This latest innovation exemplifies our unwavering commitment to the industry.”
Suggested Items
Meet the Author Podcast: Martyn Gaudion Unpacks the Secrets of High-Speed PCB Design
07/10/2025 | I-Connect007In this special Meet the Author episode of the On the Line with… podcast, Nolan Johnson sits down with Martyn Gaudion, signal integrity expert, managing director of Polar Instruments, and three-time author in I-Connect007’s popular The Printed Circuit Designer’s Guide to... series.
TTCI Joins Printed Circuit Engineering Association to Strengthen Design-to-Test Collaboration and Workforce Development
07/09/2025 | The Test Connection Inc.The Test Connection Inc. (TTCI), a leading provider of electronic test and manufacturing solutions, is proud to announce its membership in the Printed Circuit Engineering Association (PCEA), further expanding the company’s efforts to support cross-functional collaboration, industry standards, and technical education in the printed circuit design and manufacturing community.
Study on Resonance Mitigation in Metallic Shielding for Integrated Circuits
07/08/2025 | Maria Cuesta-Martin, Victor Martinez, Vidal Gonzalez Aguado, Würth ElektronikInherent cavity resonant modes often lead to significant degradation of shielding effectiveness, responsible for unwanted electromagnetic coupling. Cavity resonant modes of the metal shielding enclosure can produce two adverse problems: the mutual coupling among different RF modules and shielding effectiveness reduction of the metal enclosure. The cabinets serve to shield certain components from electromagnetic interference (EMI). However, these cavities present some resonance peaks at 5 GHz, making it impossible to use them at higher frequencies.
The Global Electronics Association Releases IPC-8911: First-Ever Conductive Yarn Standard for E-Textile Application
07/02/2025 | Global Electronics AssociationThe Global Electronics Association announces the release of IPC-8911, Requirements for Conductive Yarns for E-Textiles Applications. This first-of-its-kind global standard establishes a clear framework for classifying, designating, and qualifying conductive yarns—helping to address longstanding challenges in supply chain communication, product testing, and material selection within the growing e-textiles industry.
Magnalytix and Foresite to Host Technical Webinar on SIR Testing and Functional Reliability
06/26/2025 | MAGNALYTIXMagnalytix, in collaboration with Foresite Inc., is pleased to announce an upcoming one-hour Webinar Workshop titled “Comparing SIR IPC B-52 to Umpire 41 Functional & SIR Test Method.” This session will be held on July 24, 2025, and is open to professionals in electronics manufacturing, reliability engineering, and process development seeking insights into new testing standards for climatic reliability.