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IPC APEX EXPO 2025: We’ve Got It Covered

04/01/2025 | I-Connect007 Editorial Team
IPC APEX EXPO is the largest electronics manufacturing trade show in North America, bringing together professionals from all sectors of the supply chain to educate, network, and share their products and services. We’ve put all our coverage of the show in one easy-to-find location. Just click on “Videos,” “Show Coverage” and “Photos” to find what you’re looking for. Check back regularly as more content is added. You won’t want to miss any of our unique coverage. 

Just Because You Can, Doesn’t Mean You Should

03/20/2025 | Tony Plemel, Flexible Circuit Technologies
Decisions are usually made by gathering information and differing opinions, then making the best choice based upon that information. The same process is used when designing flexible circuits and rigid-flex circuits. For example, when designing a flex circuit or rigid-flex circuit, we consider some basic factors.

Counterfeit Electronics & Materials Symposium Program Announced and Registration Open

03/19/2025 | SMTA
The SMTA is excited to announce the technical program for the Counterfeit Electronics & Materials Symposium. The symposium will be held 15-16 April 2025 at AFC Wimbledon in London, England.

Dana on Data: The Missing AI-NPI Link

03/19/2025 | Dana Korf -- Column: Dana on Data
This year is yielding an extensive amount of communications, conferences, software updates, consultants, and news releases about how generative and re-generative artificial intelligence solutions and large language models are revolutionizing design, all with the intent to reduce new product introduction (NPI) cycle times.

INEMI Launches Study of AOI Inspection for Fine Pitch Substrates Seeking Industry Participation

03/11/2025 | iNEMI
The fine lines and spaces of increasingly popular heterogeneous SiP packages, coupled with larger panel sizes and more substrate layers, demand increased capabilities from automated optical inspection (AOI) equipment to accurately detect, characterize and reject true defects without over-rejections.
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