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Figure 7: SMT – eDashboard
There are several examples of achievement in process improvement.
First we have improved Machine Parameters Collection Architecture The older machine data was not previously collected as shown on the left side of Figure 8 with red color.
The previous data parser directly accessed a controlling PC via a shared folder. This network solution was very unstable, and machine raw data was always missed for collection to SPC system.
The right side of Figure 8 shows the new Machine Raw Data Collection Network Solution.
The new collection method for raw data is now complete. The new implementation is as follows:
1. Uses a raw data center file server.
2. Software developed that uses the task scheduler on each PC to automatically upload data to the server. Thus, our parser server is able to parse data from the server.
Figure 8: Machine Raw Data Collection Network Solution
This is another example for the connection of the Smart Factory. Previously the production printer machine was isolated with parameters only available locally on the printer. It was not able to be connected to the database centralized control and for remote monitoring to correlate failures. Software has been developed to collect and upload measured parameters to the database. Key parameters (Speed, pressure, temperature, humidity….) are now monitored helping engineers to shorten the FA time.
Figure 9 shows before and after the connection of the printer to the database to collect parameters for monitoring.
Figure 9: Production Printer Parameter Monitoring
Figure 10 shows the Solder Paste Inspection (SPI) Test Data Link to Database (MES).
Prior to this link, SPI data was only available on the SPI system making it difficult to get the test result by serial number by Location and Pad ID. Quality issue root causes were difficult to be identified with the disconnected test data.
A SPI test data parser has been developed to link to MES data with product serial number by the following:
1. Allow scanning of the product barcode to correlate test results with product serial numbers.
2. Parsing of test logs to upload to the MES database. This allows traceability back to the original point of failure.
SPI test results by serial number are uploaded to the MES database where they are correlated with First Pass Yield, Units per Hour and Defects per Hour as shown on the right side of Figure 10.
Figure 10: SPI Test Data Link to MES
Table 1. Quality and Productivity Achievements from April to July of 2015
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