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New Inspection Products
January 19, 2010 |Estimated reading time: 6 minutes
— These new products include vision sensors and systems, improved AOI machines, measurement and surface analysis products, programming environments, and other inspection tools.Vision-based Factory Controls
TTC (Track, Trace and Control) Solution, developed in partnership with Cogiscan, features proprietary TTC software. The TTC software can be partnered with any of Microscan’s machine vision or auto ID hardware to address plant-wide information. The software provides work-in-progress (WIP) visibility through any factory (tracking), validate the process flow (control), and stores the history of the process steps accomplished on a product (traceability). Efficient data collection is combined with error proofing to demonstrate process compliance, while reducing material and assembly costs. Developed for the electronics industry, the product targets complete, real-time data visibility across the plant floor for all data collection points (machine vision inspections, RFID, barcode, and 2D readers). Implementation features Web-based controls and reporting, separate from main IT plant floor network. The solution includes middleware, choice of hardware and complete visibility online for real-time reporting. Connectivity to all commonly used MES and ERP systems is easily accomplished. Additionally, it features visual warnings and alarms if a product is scanned at the entry of the wrong operation or if the operation is out of sequence. Microscan, www.microscan.com
Inspection System Improvements
The V200 automatic inspection system is now available with an optional 5M pixel camera system versus the standard 2M pixel camera. Both camera systems are available in 11- and 15.5-µm pixel resolution. With the new 5M pixel camera, inspection times are reduced by more than 34% over the 2M pixel camera. For the higher inspection speeds, a software upgrade allows inspection of areas of the PCBA that are normally unpopulated by devices. By inspecting these areas, the detection of foreign bodies like loose components that may have been generated by errors in the assembly process can be detected and reported. The new EZ programming software is also available. The EZ environment reduces programming time on the rules-based inspection system. EZ software automates the program generation process. Reductions in program generation and de-bug time of 50% or more are possible while still providing all the typical tests needed to verify a correctly assembled and soldered circuit board. Sony Manufacturing Systems America, www.sonysms.com
EDS Analysis Intelligence
The TEAM EDS system puts the knowledge of an EDS expert into the analysis system. TEAM EDS with Smart Features include Smart Diagnostics, Smart Acquisition, Smart Phase Mapping, EXpert ID and Smart Data Review that guide and assist users. The modern interface allows for an open layout and maximizes the display area for results. The monitoring and operating conditions of the system are available with Smart Diagnostics. Optimal set-up of the image collection occurs with Smart Acquisition. Guidance and dynamic adjustment of the map collection are enabled by Smart Phase Mapping. TEAM EDS offers accurate peak identification and quantification in the industry with EDAX's EXpert ID. Reports are generated in a single button click with Smart Data Review. EDAX is a unit of AMETEK Materials Analysis Division, www.edax.com
High-speed Vision Sensor
The Inspector I40 FLEX vision sensor offers fast inspection speeds and 640 × 480 resolution, working at line speed of nearly any production line to verify completeness and quality, no matter what angle or orientation product comes down the line. The I40 FLEX’s fast inspection speed increases throughput. I40 also provides more connectivity and storage capabilities, with Ethernet IP connectivity and the ability to save an unlimited number of images to an off-line system or a server. SICK, www.sickusa.com
Dimensional Measurement and Inspection Technology
The IM-6000 Series offers high-precision dimension inspection. Pattern Registration and Pattern Search functions provide simplified “Place and Press” measurement operation. The IM-6000 eliminates the need for optical comparators, X/Y stages for part positioning, CNC measuring devices, and measuring and stereo microscopes. Parts to be measured are placed on the IM’s sample tray and the measurement button pressed. No careful positioning of a part is necessary. An Intelligent Pattern Analysis Search System (iPASS) quickly and automatically locates, identifies, and measures parts placed anywhere within the unit’s 100-mm field of view. A Part Evaluation Library stores the images, measurement functions and specifications of parts and provides automatic Pattern Search, part recognition and measurement without set up the next time inspection of the same parts is performed. The system allows users to begin collecting data in just minutes following set up. The IM-6000 quickly performs up to 99 distinct measurements with the press of a button. High-precision image acquisition and sub-pixel processing allow measurement of features that were previously impossible to inspect with traditional dimensional measurement systems. Measurements include angle, radius, inner/outer diameter, circular and linear pitch, and more. Sophisticated image processing using such functions as least square fitting and abnormal data point removal provides highly accurate and reliable data. Keyence Corporation of America, www.keyence.com/PRIM6
Integrated Programming Software Suite
With Vision2009, intuitive Wizards guide users through each step of program creation and optimization. VisCAM, an intuitive graphical assistant, is available at the first step of the program creation. VisCAM gives the ability to quickly and easily set up a program, defining board layout and accurate fiducial position on a real PCB image. Teach Assist simplifies new model creation of leaded components. The software enables automatic IC dimensions measurement on real images and position inspection algorithms with few steps. This tool accommodates the creation of odd components or connectors with a minimal amount of time. The fine-tuning phase is optimized with Tune Assist that guides users during the set up of solder joint inspection parameters. Through production recording, optimum thresholds are identified to segregate good and bad solder joints, helping to avoid false calls and false accepts. Vision2009 is equipped with a Library Live Update function that allows incorporation of library changes during production with no impact on cycle time. Using tools like LibraryPro and other enhancements, the inspection system catches the maximum number of defects with the minimum number of false calls. Kaleido is an enhanced imaging technology for solder joint display and provides a color view to facilitate diagnosing defects on the Defect Viewer station. Vision2009 is based on Vi TECHNOLOGY’s modular software platform and accommodates all AOI application options including: 2D Post Print, Mixed Mode, Pre Reflow, Post Reflow, Post Wave, backplane inspection, OCV and OCR. The suite also encompasses full off-line programming capability, an optimization tool, centralized common database, cross platform program transportability, review/repair station, data mining system. Vi TECHNOLOGY, www.vitechnology.com
Desktop AOI System
The Marantz M22X DL-18/460 desktop AOI system inspects SMT and through hole (THT) components (presence, type, polarity, offset, text, etc.), reflow and wave solder joints (including meniscus), and provides 2D solder paste inspection. The system also is available for medium and large PCB sizes. M22X DL-18/460 features a high-speed digital XGA color camera as well as analysis via synthetic imaging. This latest generation system combines the speed and accuracy of the CL systems with a new lighting concept. Three pulse wave modulated (PWM) LED light sources (main, side and DOAL) can illuminate inspection points from three different angles. Up to six lighting combinations are available to obtain best failure detection for each individual inspection point. Christopher Associates Inc., www.christopherweb.com