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AOI Camera Offers Smear-free Imaging
June 12, 2007 |Estimated reading time: Less than a minute
WATERLOO, ON The Falcon 4M60 area-scan camera includes updated features for the semiconductor and electronics inspection markets. With 4-megapixel resolution at 60 frames per second (fps), the camera captures images of fine-featured, fast-moving product without distortion.
The camera uses global, non-rolling shutter technology to eliminate "smear" in image capture, and proprietary sensor technology for various operation modes. Snapshot mode provides trigger-to-image reliability with immediate image acquisition based on internal or external trigger events. Controlled integration time is reportedly accurate to 10 µsec for wafer, semiconductor, and automated optical inspection (AOI) systems. High-speed signals travel beyond 10 meters with Camera Link technology, which is said to reduce data errors, increase reliability, and facilitate ease-of-integration.
The system is compatible with DALSA's Xcelera-CL PX4 frame-grabbers for the PCI Express bus. Additional models in the Falcon family, including a color version of the AOI camera, will be released in 2007.