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Frost & Sullivan Award Stresses AOI Cost of Ownership
July 11, 2006 |Estimated reading time: Less than a minute
MINNEAPOLIS, Minn. An embedded process verification (EPV) sensor designed for internal SMT assembly-equipment inspection earned the 2006 Emerging Technology of the Year Award in automated optical inspection (AOI). Frost & Sullivan recognized CyberOptics for efforts in commercializing the technology through lowering cost-of-ownership and increasing productivity.
Unlike traditional AOI systems, the EPV uses no programming, which CyberOptics claims reduces set-up time. It provides inspection and analysis to detect a range of defects. The optics capabilities of the tool, along with its vision-processing technology, help eradicate root-cause failures in placement programs. The sensor allows inspection during the surface mount process providing data as each chip is placed.