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Scan Modules Expand Boundary-scan Application Areas
April 25, 2005 |Estimated reading time: Less than a minute
EINDHOVEN, The Netherlands — The new DIMM 2128 family of digital I/O scan modules (DIOS) from JTAG Technologies reportedly enhances testability of complex PCBs. Covering all standard DIMM connector pinouts and a wide range of operating voltages, the DIOS modules contain programmable logic and a built-in, 10-MHz oscillator, allowing implementation of embedded test instruments such as counters, function generators and timers.
Test coverage is enhanced via parallel drive and sense test points with programmable voltages to match low-voltage IC technologies. The mechanical form and pin arrangement of the DIOS modules follow JEDEC Standard 21C, facilitating integration within a production test fixture, or directly on a target PCB. Up to ten DIOS modules can be daisy-chained together, each providing up to 128 parallel channels controlled via boundary-scan, and individually program as input, output, bi-directional or tri-state signals. The I/O channels may be programmed in groups of 16 for output levels from 1.5 to 3.6 V in 100-mV steps and input thresholds from 0 to 4.0 V. Channel groups can be customized to 1, 2, 4, 8 or 16 nodes to reduce chain length and increase test throughput. DIMM modules for the following socket types are available: 100, 168, 184, 200, 240, 278, 300, 144 (small outline), 200so and 214so.