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Acoustic Micro-imaging of Multilayer Ceramic & Polymer Capacitors
June 25, 2013 |Estimated reading time: Less than a minute
The root cause of multilayer ceramic capacitor (MLCC) failures is very often some type of internal structural defect such as a crack, delamination or voids. These types of defects typically create an open circuit or leakage paths between electrodes that can disrupt the capacitor’s functioning and impact the performance of the system.
Because the defects are gaps in solid materials, they are easily imaged by the ultrasound pulsed into MLCCs by acoustic microscopes. SonoLab has been imaging MLCCs for three decades. Typically, the screening involves a range of small to large lots of loose capacitors, with the purpose of identifying and removing capacitors that meet the user’s definition of reject before assembly begins.Read the full article here.Editor's Note: This article originally appeared in the June 2013 issue of SMT Magazine.