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Akrometrix Launches New Warpage Metrology System
June 29, 2017 | Akrometrix LLCEstimated reading time: 1 minute
Akrometrix, LLC, the leading provider of thermal warpage and strain metrology equipment to both the front- and back-end semiconductor and electronics industries, is pleased to announce that it has launched its newest warpage metrology system – the Tabletop Shadow Moiré (TTSM) system.
“Over the years, many of our customers who are using our systems for thermal warpage metrology have stated a need for an ultra-fast, highly accurate room temperature warpage metrology system,” stated Mayson Brooks, Akrometrix President. “Additionally, they wanted a system that was small enough for a tabletop operation and that would allow them to utilize all the software features of our thermal warpage systems, only at room temperature.”
The TTSM meets this demand – enabling customers to measure warpage of substrates up to 300mm x 310 mm (a 300mm wafer or two JEDEC trays) with the entire measurement taking less than two seconds. Whether individual parts or a JEDEC tray of multiple parts, the TTSM provides an ultra-fast and highly accurate measurement at room temperature that is suited for tabletop use.
About Akrometrix LLC
Akrometrix is the leader in thermal warpage and strain metrology for the front-end/back-end wafer, back-end packaging/assembly, panel and the PCB/component markets. The company provides both capital equipment and test services to measure warpage and strain in temperatures from -50°C to 300°C on virtually any substrate up to 600mm x 600mm, regardless of shape. Located in Atlanta, Georgia, Akrometrix has been serving customers worldwide for more than 20 years based on technology developed at Georgia Tech. For more information click here.
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