-
- News
- Books
Featured Books
- smt007 Magazine
Latest Issues
Current IssueSoldering Technologies
Soldering is the heartbeat of assembly, and new developments are taking place to match the rest of the innovation in electronics. There are tried-and-true technologies for soldering. But new challenges in packaging, materials, and sustainability may be putting this key step in flux.
The Rise of Data
Analytics is a given in this industry, but the threshold is changing. If you think you're too small to invest in analytics, you may need to reconsider. So how do you do analytics better? What are the new tools, and how do you get started?
Counterfeit Concerns
The distribution of counterfeit parts has become much more sophisticated in the past decade, and there's no reason to believe that trend is going to be stopping any time soon. What might crop up in the near future?
- Articles
- Columns
Search Console
- Links
- Media kit
||| MENU - smt007 Magazine
Goepel electronic Extends Embedded JTAG Solutions Integration to Digitaltest ICT
December 28, 2017 | GOEPEL ElectronicEstimated reading time: 1 minute
Goepel electronic has extended its portfolio of Embedded JTAG Solutions integration into in-circuit testers (ICT) to the Sparrow MTS30 from Digitaltest. With the fully integrated software package, user will have a comfortable test development with dedicated interfaces for the data exchange of both systems.
The combined test solution can be used in a variety of areas, from the individual diagnosis of single high-quality PCBs to the high-volume production of automotive products. At the same time, so-called "branding" is moving more and more in the focus, meaning the standard hardware is programmed after the ICT with user-specific software and then functionally tested. By using special embedded JTAG technologies and parallelization, the programming and test times can be reduced enormously.
The compact and cost-optimized Sparrow MTS30 ICT module was specially designed by Digitaltest for installation in 19-inch racks, thus offering a supplement for integration into entire test concepts for functional tests. By using Embedded System Access, the UUT (Unit Under Test) can be tested, programmed and functionally evaluated via its native interfaces (JTAG, SWD, BDM or SBW). This closes the circle around the partly individual test concept of a modern electronic assembly.The transceiver card from GOEPEL electronic is based on the SCANFLEX platform, providing 6 test access ports (TAP). Only one slot is required in the Sparrow MTS30.
Suggested Items
Kimball Electronics Thailand Namlee School
12/26/2024 | Kimball ElectronicsKimball Electronics Thailand (KETL) has continued its commitment to supporting education and community development in Thailand.
Solar Powered Aircraft Achieves New Stratospheric Success
12/26/2024 | BAE SystemsA British-led team of engineers has taken a leap forward in the race to harness the stratosphere for earth observation and communications, completing a new series of test flights of BAE Systems’ High Altitude Pseudo Satellite (HAPS) Uncrewed Aerial System (UAS), PHASA-35®, in quick succession.
The Test Connection Inc. Doubles Annual Donation to Streets of Hope
12/26/2024 | SMTAThe Test Connection Inc. (TTCI), a leading provider of electronic test and manufacturing solutions, is proud to announce its continued support for Streets of Hope, a Baltimore-based charity dedicated to providing food and shelter to men in need.
Biden-Harris Administration Announces CHIPS Incentives Award with Amkor Technology to Bring End-to-End Chip Production to the U.S.
12/25/2024 | U.S. Department of CommerceThe Biden-Harris Administration announced that the U.S. Department of Commerce awarded Amkor Technology Arizona, Inc., a subsidiary of Amkor Technology, Inc., up to $407 million in direct funding under the CHIPS Incentives Program’s Funding Opportunity for Commercial Fabrication Facilities.
Saki to Highlight Advanced Inspection Innovation at 39th NEPCON JAPAN
12/23/2024 | Saki CorporationSaki Corporation, an innovator in the field of automated optical and X-ray inspection equipment, will be exhibiting at the 39th NEPCON JAPAN at the Tokyo Big Site Exhibition Center.