-
- News
- Books
Featured Books
- smt007 Magazine
Latest Issues
Current IssueIntelligent Test and Inspection
Are you ready to explore the cutting-edge advancements shaping the electronics manufacturing industry? The May 2025 issue of SMT007 Magazine is packed with insights, innovations, and expert perspectives that you won’t want to miss.
Do You Have X-ray Vision?
Has X-ray’s time finally come in electronics manufacturing? Join us in this issue of SMT007 Magazine, where we answer this question and others to bring more efficiency to your bottom line.
IPC APEX EXPO 2025: A Preview
It’s that time again. If you’re going to Anaheim for IPC APEX EXPO 2025, we’ll see you there. In the meantime, consider this issue of SMT007 Magazine to be your golden ticket to planning the show.
- Articles
- Columns
Search Console
- Links
- Media kit
||| MENU - smt007 Magazine
JTAG Visualizer Update Adds Features for Faster Debug
January 16, 2018 | JTAG TechnologiesEstimated reading time: 3 minutes

The speed of change in the electronics industry is rapidly accelerating. The direction in which the industry moves is constantly shifting and it needs participation, see you in San Diego. JTAG Technologies is excited to showcase here in San Diego the latest version of its acclaimed Visualizer graphical viewing tool for board (PCB) layouts and schematics. Allowing users to assess fault coverage data and pin-point production test faults in a snap.
Wide-ranging CAD support
With its wide range of CAD (EDA) tool import filters Visualizer is the number one choice for professional boundary-scan development and test engineers. Users can import schematic data direct from Mentor (Pads, DxDesigner, Capture) Cadence, Altium and Zuken tools as well as board layout information in ODB++ and a dozen other vendor specific formats.
JTAG Maps
Introduced in this version of Visualizer, the new Maps feature offers a basic test-accessibility view by a simple click of the mouse. The view can easily be fine-tuned by adding just a few key component descriptions to a look up table. What’s more using customisable colors to indicate test coverage levels or access types, a color-coded schematic can be displayed or printed. Once the design has been optimized for boundary-scan test coverage and committed to layout, final application development can begin in the JTAG ProVision developer tool.
Additional new features
Visualize on (Test) Fail -When running a test sequence or during test debug within ProVision it is now possible to view all failing circuit nets on a schematic view, a layout view or both – automatically. This feature is ideal for small-scale production systems where the test operator is also responsible for fault diagnosis and rework.
Locate Next – during fault-finding the ‘locate next’ feature allows the user to track the course of a net connection through the layers of a PCB layout or the sheets of a schematic.
Multiple Color Themes - users can now define multiple color themes for distinguishing different net classifications e.g. for percentage fault coverage in schematics or fault nets in layouts to aid in debug and repair
View through layers - a highlighted fault net, perhaps as a result of a detected board connection fault, can now be viewed along its entire path and as it changes course through the board (pcb) layers.
Add notes – A note can be added anywhere at a fixed position on the schematic or layout. Ideal for conveying additional information about test processes or passing design details back and forth between users.
Peter van den Eijnden, MD JTAG Technologies, comments ‘ Our impressive enhancements to Visualizer come as a result of our commitments to customer liaison and also our work with various 3rd parties such as the EDA vendors’.
Another JTAG Highlight at APEX 2018 - ATE Integration: Simple and effective improvement of test coverage
Clients need to improve the overall test coverage of their assembled boards. It’s easy. Clients can simply combine their JTAG Technologies boundary-scan tools with todays’ existing automatic test equipment (ATE). JTAG works with any vendor of in-circuit testers (ICT), flying probes (FPT) or functional testers (FT).
ATE integration is completely trouble free and merely involves adapting execution software to operate in the specific ATE environment. In many cases we at JTAG develop dedicated, customized versions of the boundary-scan controllers or pods. This simplifies mechanical integration and preserves signal integrity.
Our experts will discuss the level of integration variation according to your needs.
About JTAG Technologies
JTAG Technologies is a market leader and technology innovator of boundary-scan software and hardware products and services. The company was the first to bring to the market such important advances as automated test generation, automated fault coverage analysis, automated flash and PLD programming via boundary-scan, and visualized boundary-scan analysis. Its customers include world leaders in electronics design and manufacturing such as Bae, Ericsson, Flextronics, Honeywell, Medtronic, Motorola, Philips, Raytheon, Rockwell-Collins, Samsung, and Sony. Its innovative boundary-scan products provide test preparation, test execution, test result analysis and in-system programming applications. With an installed base of over 9000 systems worldwide, JTAG Technologies serves the communications, medical electronics, avionics, defence, automotive, and consumer industries with offices throughout North America, Europe and Asia. JTAG Technologies headquarters are located in Eindhoven, The Netherlands. For more information, click here.
Suggested Items
Discover TRI Test Solutions at New-Tech 2025
05/08/2025 | TRIBynet Testing Systems, TRI's industry partner, will join New-Tech 2025 at EXPO Tel-Aviv, Pavilion 1 from May 20 – 21, 2025.
Datest Expands Presence in the Upper Midwest with Omni-Tec Partnership
05/05/2025 | DatestDatest, a trusted leader in advanced testing, engineering, inspection, and failure analysis services, is proud to announce its partnership with Gary Krieg of Omni-Tec, Inc. as its official sales representative in the Upper Midwest.
Northrop Grumman’s IVEWS Completes F-16 Electronic Warfare Operational Assessment
05/05/2025 | Northrop GrummanNorthrop Grumman Corporation’s IVEWS (Integrated Viper Electronic Warfare Suite) has successfully completed Operational Assessment flight testing on U.S. Air Force F-16 aircraft, demonstrating its effectiveness against advanced radar-guided threats.
Cadence Expands Design IP Portfolio Optimized for Intel 18A and Intel 18A-P Technologies, Advancing AI, HPC and Mobility Applications
05/01/2025 | Cadence Design SystemsCadence announced a significant expansion of its portfolio of design IP optimized for Intel 18A and Intel 18A-P technologies and certification of Cadence® digital and analog/custom design solutions for the latest Intel 18A process design kit (PDK).
The Knowledge Base: Unlocking the Invisible—The Critical Role of X-ray Technology
04/29/2025 | Mike Konrad -- Column: The Knowledge BaseFrom detecting voids under BGAs to solder defects in high-reliability applications, X-ray inspection has become an indispensable tool in modern manufacturing. But how is the technology evolving? What challenges do experts face in deploying X-ray inspection effectively and what does the future hold for this critical quality assurance method?