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Microtek Laboratories China Adds High-Voltage HAST CAF Test
December 30, 2018 | Microtek Laboratories ChinaEstimated reading time: Less than a minute
Microtek has added high-voltage testing capability for HAST-based CAF testing. The HAST chamber's ability to maintain 85% relative humidity at temperatures over 100°C at up to 1,000 V generates the toughest CAF test environment currently possible for base material and PCB reliability evaluation.
"We have successfully completed two high-voltage CAF tests in our HAST chambers. The automotive and transportation industries are continuing to push the limits of current test technology in an effort to further accelerate and understand the reliability of base materials and PCBs. Microtek has, at the same time, continued to invest in equipment and technology to service these demands," said Bob Neves, chairman and CTO of Microtek.
Microtek's commitment to automotive and transportation testing also includes the use of 10 thermal shock chambers equipped for single hole or daisy chain reliability testing, along with 28 humidity and HAST chambers equipped with 256 channels of CAF/ECM/SIR testing capability up to 2,000 VDC.
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Gardien Services Installs Customized G93 Flying Probe Tester – Largest Test Area in North America/Europe
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Meet with The Test Connection Inc. (TTCI) at SMTA Guadalajara 2025
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MoU to Revolutionize Photonic Integrated Circuit (PIC) Device Testing with AI-Driven Solutions
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Register Now for the HATS²™ Technical Day at GEN3 HQ
08/05/2025 | GEN3GEN3 a world-leading manufacturer of testing, measurement and production solutions for electronics reliability. Headquartered in Farnborough, UK, GEN3 is announcing the final call for registrations to attend the exclusive HATS²™ Technical Day — a hands-on, live demonstration event showcasing the Highly Accelerated Thermal Shock Tester (HATS²™), the groundbreaking innovation from industry pioneer Bob Neves.