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TRI to Showcase Test and Inspection Systems at electronica 2020
September 1, 2020 | Test Research Inc.Estimated reading time: 1 minute
Test Research, Inc. (TRI), a leading test and inspection systems provider for the Electronics Manufacturing Industry, will join electronica 2020 held at Messe München in Munich, Germany Nov. 10-13 to showcase the latest innovation in SMT test and inspection. Visit booth #A1-459 to see TRI's 3D SPI, 3D AOI, 3D AXI, Multi-Core ICT and AI-powered solutions in action.
Uncover your production line defects with the TRI's Inspection solutions on display at electronica 2020. TRI will exhibit the Global Technology Award-winning TR7007QI series 3D SPI. Furthermore, presenting the multi-angle 3D AOI TR7500QE offering higher quality imaging for side view inspection.
TRI will also showcase the recently released 3D AOI TR7700Q SII and the 3D AXI TR7600F3D SII. The TR7700Q SII has an improved optical system that increases stability and increases speed up to 25%, compared to the last model. The TR7600F3D SII soars speeds as to twice to three times as fast as the previous model. Complete your SMT Inspection with the Multi-core ICT TR5001Q SII INLINE with LED analyzing capabilities.
Visit TRI's booth at electronica 2020 to experience Smart Factory Solutions such as YMS 4.0 and the AI Repair Station. Our experts will reveal the advantages of TRI's high-performance hardware design can bring to your production. TRI's systems are designed to interoperate with other manufacturing equipment to minimize downtime, optimize production quality, and reduce operator workload.
Suggested Items
Magnalytix and Foresite to Host Technical Webinar on SIR Testing and Functional Reliability
06/26/2025 | MAGNALYTIXMagnalytix, in collaboration with Foresite Inc., is pleased to announce an upcoming one-hour Webinar Workshop titled “Comparing SIR IPC B-52 to Umpire 41 Functional & SIR Test Method.” This session will be held on July 24, 2025, and is open to professionals in electronics manufacturing, reliability engineering, and process development seeking insights into new testing standards for climatic reliability.
Defense Speak Interpreted: Is DARPA Still Around After CHIPS?
06/24/2025 | Dennis Fritz -- Column: Defense Speak InterpretedWhen I first published my Defense Speaks Interpreted column in January 2019 on the Defense Advanced Research Projects Agency (DARPA ERI), the agency advocated for an expanded Defense emphasis on closing the growing technology gap in microelectronics. The emphasis was on “resurgence.”
I-Connect007 Editor’s Choice: Five Must-Reads for the Week
06/13/2025 | Marcy LaRont, I-Connect007Today is Friday the 13th, and in much of Western folklore, this is a day when bad luck is lurking. But while Friday the 13th may top Western superstition charts, the global calendar is sprinkled with its own unlucky legends. In Spain and Greece, the bad juju lands on Tuesday the 13th—a day linked to Mars, the god of war, and naturally, chaos. In Italy, it’s Friday the 17th that is feared, thanks to the Roman numeral XVII, which can be rearranged to spell VIXI—Latin for “I have lived” (a poetic way of saying you’re dead).
TTCI Celebrates Melanie Rutkauskas’ 10-Year Anniversary and Her Leadership of New Training Division
06/12/2025 | TTCIThe Test Connection Inc. (TTCI), a leading provider of electronic test and manufacturing solutions, is proud to celebrate Melanie Rutkauskas on her 10-year anniversary with the company.
Bridging the Knowledge Gap in Test: A Conversation with Bert Horner
06/11/2025 | Barry Matties, I-Connect007Bert Horner is a seasoned industry veteran and co-creator of The Test Connection, Inc. (TTCI), a test and inspection company spanning over 45 years. In this candid conversation, Bert reflects on the challenges our industry faces with the retirement of career professionals and the subsequent loss of critical tribal knowledge. As he unveils The Training Connection’s innovative training initiatives, Bert emphasizes the importance of evolving educational programs that align with industry needs, particularly in design for test (DFT), and sheds light on strategies being implemented to foster the next generation of engineers.