Indium’s Sze Pei Lim to Present on Solder Joint Reliability at IMPACT Conference in Taipei

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Indium Corporation Senior Global Product Manager for Semiconductor and Advanced Materials, Sze Pei Lim, will be part of a panel presentation at the International Microsystems, Packaging, Assembly and Circuits Technology (IMPACT) conference in Taipei, Taiwan on October 27. The presentation will cover the findings from a technical paper titled The Effects of Voids on Solder Joint Reliability in First Level Interconnect.

First level interconnect (FLI), e.g., flip-chip attach on substrate or wafer, using solder as the interconnect material, is employed extensively in advanced packaging assembly. During the flip-chip die-attach process, some voids are often formed in the solder joints. In the past, this may not have been seen as a major issue since the voiding percentage is typically less than 10%; however, as miniaturization continues, the solder joint of FLI is becoming smaller (

As Senior Global Product Manager for Semiconductor and Advanced Materials, Lim works closely with R&D and manufacturing, and engages with the world’s leading semiconductor companies and contract manufacturers. She is a task force member of the International Electronics Manufacturing Initiative (iNEMI) Packaging Technology Integration Group and has co-chaired a number of industry projects and road-mapping initiatives over the past five years. She is also on the executive committee of the Institute of Electrical and Electronics Engineers (IEEE) Packaging Society, Malaysia Chapter. Lim is a part of the organizing committee for the International Electronics Manufacturing Technology (IEMT). She has authored a number of technical papers and presented regularly in various international technical conferences. She holds a bachelor’s degree from the National University of Singapore, where she majored in industrial chemistry with a focus in polymers. She is a Certified SMT Process Engineer and has earned her Six Sigma Green Belt designation.

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