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IPC Raymond E. Pritchard Hall of Fame Award: Pierre-Jean Albrieux

05/10/2024 | Marcy LaRont, PCB007 Magazine
Congratulations to Pierre-Jean Albrieux, who received the 2024 IPC Raymond E. Pritchard Hall of Fame Award. The award is given to individuals in recognition of the highest level of achievement, extraordinary contributions, and distinguished service to IPC and toward the advancement of the industry, including helping to create a spirit of mutual esteem, respect, and recognition among members consistent with the goals and mission of IPC.

IPC Focuses on Education and Onboarding

05/09/2024 | Andy Shaughnessy, Design007 Magazine
I recently spoke with Carlos Plaza, senior director of education for IPC, about expanding educational efforts in the PCB design, fabrication, and assembly segments. As Carlos explains, PCB design is a hot topic, but onboarding may be the hottest one of all.

Real Time with… IPC APEX EXPO 2024: Industry Growth, Challenges, and Technological Advancements

05/09/2024 | Real Time with...IPC APEX EXPO
Editor Nolan Johnson and Shawn DuBravac, IPC chief economist, dive into key industry topics such as growth, challenges, and technological advancements. They discuss shifts in the global competitive landscape, downstream demand, customization, and how AI is enhancing human skills. The industry outlook appears promising for both the short and long term.‌

Real Time with… IPC APEX EXPO 2024: The Driving World of e-Mobility with Indium

05/08/2024 | Real Time with...IPC APEX EXPO
In the competitive EV market, technology plays a crucial role facing the challenges of infrastructure. As Brian O'Leary explains, Indium's e-Mobility product suite includes proven solder and thermal management products for high reliability.

Real Time with… IPC APEX EXPO 2024: Understanding Objective Evidence in Manufacturing Processes

05/07/2024 | Real Time with...IPC APEX EXPO
Graham Naisbitt explains the importance of objective evidence in manufacturing processes, debunking the common misconception that the ROSE test is a cleanliness test. He also discusses the introduction of Rev J, a requirement for measuring ionic contamination on circuit assemblies, and the challenges in accurately measuring contamination. Alternative methods like ion chromatography and the need for updating standards like the ROSE test are mentioned.
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