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Koh Young and its Partners Bringing True3D Inspection Solutions to India at Productronica and SEMICON Shows
August 13, 2024 | Koh YoungEstimated reading time: 3 minutes
Koh Young Technology, the industry leader in True 3D measurement-based inspection solutions, will be highlighting its innovative inspection solutions designed to enable smart factories at Productronica India, from September 11-13, 2024, at the India Expo Mart (IEML) in Greater Noida, Delhi, India. We are proud to feature our presence at Koh Young booth H15.H11 and support our regional sales partners with machines in the NMTronics India Pvt. Ltd. booths at H14.C01 and H3.O01, as well as in the Panasonic Life Solutions India Pvt. Ltd. booth at H15.F01. Together, the three companies will prove why so many electronics manufacturers across India and the world trust Koh Young for their inspection needs.
At the Koh Young booth H15.H11, we will highlight the award-winning Neptune C+ for True 3D in-line dispensing process inspection. The Neptune is the industry’s first 3D optical measurement solution for transparent material inspection. Using Koh Young's L.I.F.T. technology (Laser Interferometry for Fluid Tomography), the Neptune delivers non-destructive 3D inspection to precisely measure and inspect wet or dry materials. With its Machine-Learning algorithm, the Neptune accurately measures materials for coverage, thickness, and consistency with user-defined threshold settings. It also identifies bubbles, cracks, and other defects in coatings. It measures underfill, epoxy, bonding, glue, potting, flux, and more, providing exact measurements of transparent and translucent materials.
Additionally, we will unveil a brand-new automated optical inspection (AOI) solution dedicated to helping quality-conscious manufacturers adopt celebrated Koh Young inspection technology at a more economical price point. Koh Young will also show how KSMART turns data into insight using AI-powered solutions to help automate process control. Focusing on data management, analysis, and optimization, it collects data from across the factory for defect detection, real-time optimization, enhanced decision-making, and traceability to improve production, increase quality, and lower costs by eliminating false calls and escapes.
In booth H14.C01, NMTronics will highlight the best-selling SPI and AOI machines in India. For SMT AOI, schedule a demonstration on the Zenith Alpha, our value-based True 3D AOI. It delivers perfect inspection performance with True 3D measurement technology. Based on full 3D measurement technology from the development phase, it avoids the shortcomings of adding 3D to 2D technology. This approach provides trustworthy inspection results, regardless of component or board color variations. When our 3D measurement data meets artificial intelligence, we deliver even more advantages to manufacturers.
Complementing the AOI is the KY8080 solder paste inspection (SPI) machine. Delivering an ideal mix of cost and performance, the KY8080 provides the best value for a varied set of application needs that demand enhanced product quality, increased productivity, and improved operational efficiency.
At booth H15.F01, Panasonic will display additional Koh Young SPI and AOI models. In addition to the Zenith Alpha AOI machine, Panasonic will display our KY8030-2. The KY8030 SPI Series has maintained the industry’s leading position as the best-selling True 3D SPI since entering the market. Combining Koh Young’s patented 3D dual-inspection Moiré projection technology, it effectively eliminates critical shadow and specular reflection challenges that other 3D inspection systems cannot address. The systems also feature active warp compensation and automated solder paste dispensing with auto-rework capabilities. Going beyond traditional solder paste inspection, it includes self-diagnosis for optimal performance maintenance, marking a new era in efficiency.
At the co-located SEMICON India exposition, Koh Young and NMTronics will highlight our Meister D+ semiconductor inspection solution in booth H3.O01. The Meister D+ represents a breakthrough in 3D measurement for highly reflective, shiny die. By combining industry-leading Moiré technology with new proprietary optics, the Meister D+ effectively addresses the long-standing challenge of inspecting highly reflective die. This advanced system can inspect small die and components, down to the 0201 metric or 008004 EIA size. It also excels in narrow-gap inspections as small as 50 microns and provides precise height and tilt measurements in high-density, highly reflective applications. The Meister D+ ensures comprehensive inspection for micro cracks, chipping, foreign material, and more, setting a new standard in the industry.
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