-
- News
- Books
Featured Books
- design007 Magazine
Latest Issues
Current IssueLearning to Speak ‘Fab’
Our expert contributors clear up many of the miscommunication problems between PCB designers and their fab and assembly stakeholders. As you will see, a little extra planning early in the design cycle can go a long way toward maintaining open lines of communication with the fab and assembly folks.
Training New Designers
Where will we find the next generation of PCB designers and design engineers? Once we locate them, how will we train and educate them? What will PCB designers of the future need to master to deal with tomorrow’s technology?
The Designer of the Future
Our expert contributors peer into their crystal balls and offer their thoughts on the designers and design engineers of tomorrow, and what their jobs will look like.
- Articles
- Columns
Search Console
- Links
- Media kit
||| MENU - design007 Magazine
'Let’s Talk Production Test' with Bert Horner of The Test Connection, Inc. at SMTA Long Island Meeting
April 2, 2025 | The Test Connection Inc.Estimated reading time: 1 minute

The Test Connection Inc. (TTCI), a leading provider of electronic test and manufacturing solutions, is pleased to announce that its President, Bert Horner, will present at the SMTA Long Island Chapter Technical Meeting & Dinner on Wednesday, April 16, 2025. The event will take place at the Radisson Hotel Hauppauge in Hauppauge, NY.
Horner’s presentation, “Let’s Talk Production Test,” will delve into the challenges and benefits of various production test methodologies, offering valuable insights on the difficulties and rewards of implementing effective test strategies. Drawing on his extensive industry experience, Horner will discuss proven techniques to optimize testing processes, ensuring both efficiency and high-quality standards in electronics manufacturing.
This event presents an excellent opportunity for professionals in the electronics manufacturing industry to gain expert knowledge, network with peers, and engage in discussions about best practices for production testing.
As the founder of The Test Connection, Inc., Bert Horner has dedicated his career to delivering innovative testing solutions aimed at improving production efficiency and product quality. His expertise spans a wide range of production test methodologies, and he is passionate about helping companies optimize their testing processes. With years of hands-on experience, Bert is a recognized leader and friendly face in the field, frequently speaking on production testing and industry best practices.
Don't miss this informative session! Advance registration is required. Secure your spot today. Register on the SMTA.org events page.
Suggested Items
Teradyne Announces Production System for Double-Sided Wafer Probe Test for Silicon Photonics
04/02/2025 | TeradyneTeradyne, a leading provider of automated test equipment, has partnered with ficonTEC, a global leader in production solutions for photonics assembly and test, to announce the availability of the first high-volume, double-sided wafer probe test cell for silicon photonics.
TRI Test Solutions at INNOELECTRO 2025
04/02/2025 | TRIAnytest will join INNOELECTRO 2025, held at BOK Sportcsarnok from April 8 – 10, 2025, to showcase TRI's Test Solution.
Yamaha Reveals Latest Updates Boosting Ease of Use in 1 STOP SMART SOLUTION
04/01/2025 | Yamaha Robotics SMT SectionYamaha Robotics SMT Section has announced automated programming capabilities in YSUP factory software that streamline program generation for all surface-mount processes, including dispensing, printing, placement, and inspection.
Sierra Circuits Inc. Chooses atg A9L Flying Probe Technology for High-speed Electrical Test
04/01/2025 | atg Luther & Maelzer GmbHatg Luther & Maelzer GmbH confirms delivery of high-speed bare board testing technology to PCB fabricator Sierra Circuits Inc. in Sunnyvale, CA.
Real Time with... IPC APEX EXPO 2025: Akrometrix—Creative Approaches to Measuring Thermal Warpage
03/31/2025 | Real Time with...IPC APEX EXPONeil Hubble discusses his research on measuring thermal warpage which focuses on challenges in testing small, thin samples. He introduces non-destructive testing methods that effectively measure without damaging components. Neil highlights the industry's growing interest in AI and outlines future technology goals, including improved resolution and automation to enhance production efficiency.