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Trouble in Your Tank: Metallizing Flexible Circuit Materials—Mitigating Deposit Stress

08/04/2025 | Michael Carano -- Column: Trouble in Your Tank
Metallizing materials, such as polyimide used for flexible circuitry and high-reliability multilayer printed wiring boards, provide a significant challenge for process engineers. Conventional electroless copper systems often require pre-treatments with hazardous chemicals or have a small process window to achieve uniform coverage without blistering. It all boils down to enhancing the adhesion of the thin film of electroless copper to these smooth surfaces.

Federal Electronics Mexico Boosts Speed and Flexibility with New Mycronic A40DX Pick-and-Place

07/23/2025 | Federal Electronics
Federal Electronics, a leader in providing advanced electronic manufacturing services, has announced a major upgrade at its Hermosillo, Mexico facility with the installation of a Mycronic MYPro A40DX Pick-and-Place system, advancing its surface mount assembly capabilities for high-reliability electronics manufacturing.

Federal Electronics Continues to Enhance Inspection Capabilities at Hermosillo Facility: Installs New Mycronic PI Primo M 3D SPI System

07/22/2025 | Federal Electronics
Federal Electronics, a leader in providing advanced electronic manufacturing services, has installed a new Mycronic PI Primo M 3D Solder Paste Inspection (SPI) system at its Hermosillo, Mexico facility, advancing the site’s precision inspection and process control capabilities.

Federal Electronics Invests in HydroJet Inline Cleaning Technology at Hermosillo Facility

07/15/2025 | Federal Electronics
Federal Electronics, a leader in providing advanced electronic manufacturing services, has strengthened the advanced cleaning capabilities of its Hermosillo, Mexico facility with the recent installation of a HydroJet Inline Cleaner from Austin American Technology (AAT).

Happy’s Tech Talk #40: Factors in PTH Reliability—Hole Voids

07/09/2025 | Happy Holden -- Column: Happy’s Tech Talk
When we consider via reliability, the major contributing factors are typically processing deviations. These can be subtle and not always visible. One particularly insightful column was by Mike Carano, “Causes of Plating Voids, Pre-electroless Copper,” where he outlined some of the possible causes of hole defects for both plated through-hole (PTH) and blind vias.
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