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Beyond the Rulebook
What happens when the rule book is no longer useful, or worse, was never written in the first place? In today’s fast-moving electronics landscape, we’re increasingly asked to design and build what has no precedent, no proven path, and no tidy checklist to follow. This is where “Design for Invention” begins.
March Madness
From the growing role of AI in design tools to the challenge of managing cumulative tolerances, these articles in this issue examine the technical details, design choices, and manufacturing considerations that determine whether a board works as intended.
Looking Forward to APEX EXPO 2026
I-Connect007 Magazine previews APEX EXPO 2026, covering everything from the show floor to the technical conference. For PCB designers, we move past the dreaded auto-router and spotlight AI design tools that actually matter.
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Magnalytix and Foresite to Host Technical Webinar on SIR Testing and Functional Reliability
June 26, 2025 | MAGNALYTIXEstimated reading time: 1 minute
Magnalytix, in collaboration with Foresite Inc., is pleased to announce an upcoming one-hour Webinar Workshop titled “Comparing SIR IPC B-52 to Umpire 41 Functional & SIR Test Method.” This session will be held on July 24, 2025, and is open to professionals in electronics manufacturing, reliability engineering, and process development seeking insights into new testing standards for climatic reliability.
The webinar will provide a deep dive into the differences between the traditional IPC B-52 SIR method and the newly introduced Umpire 41 Test Method. Attendees will gain expert insight into how functional and SIR testing under temperature, humidity, and electrical bias conditions can better simulate real-world use environments—enabling more accurate assessments of residue impact, material compatibility, and long-term reliability.
“Umpire 41 is designed to characterize, qualify, and validate the electronic assembly process in a way that aligns more closely with field reliability,” said Mike Bixenman, President of Magnalytix. “It represents a leap forward in ensuring Class 3 hardware meets the demands of harsh environments.”
Joining the discussion will be Terry Munson, President and Senior Technical Consultant at Foresite, Inc., who brings over 33 years of experience in electronic cleanliness and reliability testing. A widely respected industry expert, Munson is the inventor of the patented C3 (Critical, Cleanliness, Control) test system and author of over 150 published works. He also developed the Ion Chromatography Test Method IPC-610 2.3.28 and has contributed extensively to contamination control strategies across the electronics industry.
Participants will come away with a clear understanding of both test methods and how Umpire 41 can be used to improve product performance and reduce failures in the field.
For more information and to register, contact Maglanytix.
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Julia McCaffrey - NCAB GroupSuggested Items
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