Share on:

Share on LinkedIn Share on X Share on Facebook Share with email

Testimonial

"Advertising in PCB007 Magazine has been a great way to showcase our bare board testers to the right audience. The I-Connect007 team makes the process smooth and professional. We’re proud to be featured in such a trusted publication."

Klaus Koziol - atg

Suggested Items

Fraunhofer IPMS Develops Wafer-Level High-Density Chiplet Systems

05/20/2026 | Fraunhofer IPMS
Breakthrough in chip manufacturing: As part of the European APECS pilot line, researchers at Fraunhofer Institute for Photonic Microsystems IPMS have developed a method that allows different chip components to be fused almost seamlessly into a single unit.

Fraunhofer IPMS Adds Ultratrace Elemental Analysis for Wafers

03/06/2026 | Fraunhofer IPMS
The Fraunhofer Institute for Photonic Microsystems IPMS is expanding its analytical capabilities in the field of wafer contamination.

Fraunhofer IPMS Launches Project AIS Edge Node

12/09/2025 | Fraunhofer
The Fraunhofer Institute for Photonic Microsystems (IPMS) has launched the AIS-Edge Node project (Adaptive Integrated Inline Sensors for Infrastructure in the Environmental and Hydrogen Economy), working alongside numerous regional partners.

Fraunhofer IPMS Develops Next-Gen Optoelectronic Sensors in OASYS Project

12/05/2025 | Fraunhofer
In the OASYS joint project, Optoelectronic Sensors for Application-Oriented Systems for Life Sciences and Intelligent Manufacturing, Fraunhofer Institute for Photonic Microsystems IPMS is collaborating with research and industry partners to develop state-of-the-art optoelectronic sensor technologies.

Taming AI's Hunger for Data: Using The Smallest Technology Nodes For Energy-Efficient AI

12/02/2025 | Fraunhofer
Artificial intelligence works fast, but its energy consumption is growing rapidly. A German-Taiwanese research team is now developing a solution: new memory for leading chip technologies smaller than 3 nm.
Copyright © I-Connect007 | IPC Publishing Group Inc. All rights reserved. Log in