Rethinking Test Strategy: New Book Tackles DFT for Today’s Complex Electronics
March 10, 2026 | I-Connect007Estimated reading time: 2 minutes
I-Connect007, the leading media source for the electronics manufacturing industry, proudly announces the release of The Printed Circuit Assembler’s Guide to… Design for Test: A Practical Guide to Test and Inspection.
As electronics grow more complex, geometries shrink, and packaging densities increase, traditional testing and inspection methods are no longer sufficient. In this timely new release, industry expert Bert Horner of The Test Connection, Inc. provides a practical roadmap for integrating design for test (DFT) into PCB and CCA development, beginning at schematic capture and layout, rather than treating testing as an afterthought.
This comprehensive guide explores smarter access strategies for today’s high-density designs, including boundary scan, built-in self-test (BIST), flying probe, in-circuit test (ICT), and functional testing. Central to the book is the PCOLA-SOQ framework, a structured, measurable method for evaluating inspection and test coverage at both the component and pin levels.
Horner emphasizes that successful DFT implementation requires technical adjustments and a cultural shift. By making test strategy a shared responsibility across engineering, manufacturing, quality, and leadership, organizations can move from reactive troubleshooting to proactive quality assurance.
“Organized like a practical textbook, this book addresses one of the most persistent challenges in electronics manufacturing—ensuring testability without sacrificing innovation,” said Nolan Johnson, SMT007 managing editor. “Bert Horner provides a clear, actionable framework that enables organizations to embed test strategy early, measure it effectively, and align teams around quality from the start.”
Part of I-Connect007’s trusted Printed Circuit Assembler’s Guide to… series, this latest installment reinforces the company’s commitment to delivering practical, expert-driven resources for today’s electronics professionals.
The Printed Circuit Assembler’s Guide to… Design for Test: A Practical Guide to Test and Inspection is available exclusively through I-Connect007’s Educational Resource Center. Download the book today by visiting iconnect007.com/dft.
Testimonial
"In a year when every marketing dollar mattered, I chose to keep I-Connect007 in our 2025 plan. Their commitment to high-quality, insightful content aligns with Koh Young’s values and helps readers navigate a changing industry. "
Brent Fischthal - Koh YoungSuggested Items
BAE Systems Provides Advanced Aircraft Readiness with New Link 16 Test Capability for F-16
05/14/2026 | BAE SystemsBAE Systems has completed the successful development and integration of an upgraded Link 16 test capability for Multifunctional Information Distribution System Joint Tactical Radio System (MIDS JTRS) terminals on U.S. Air Force F-16 aircraft.
Separating Fact from Fear on the FCC ‘China Lab Ban’
05/14/2026 | Jan Pedersen, NCAB GroupRecent news headlines have suggested that the U.S. Federal Communications Commission (FCC) has “banned all testing laboratories in China and Hong Kong.” Understandably, this has created concerns around PCB testing, material approvals, UL listings, and the continued use of established test laboratories in Asia. The good news is that for most PCB, PCB material, and PCBA testing, nothing has changed. Let’s separate fact from fear.
yieldWerx, WATS Partner to Bridge PCB Test with Chip-Level Manufacturing Data
05/11/2026 | PRNewswireBoard-level and semiconductor test data are often analyzed separately, limiting correlation across the product lifecycle. Linking PCB assembly (PCBA) test results, including in-circuit and functional test, with upstream wafer, sort, and final test data remains difficult, particularly in photonics, advanced packaging, and high-density integration environments.
SPEA Expands Global Footprint with New Hub in Santa Clara, Silicon Valley
05/08/2026 | SPEASPEA has officially landed in the heart of Silicon Valley, with the grand opening of its newest facility in Santa Clara, California.
More Than Electrical Test: TTCI to Spotlight X-ray and CT Capabilities at SMTA Capital Expo
05/07/2026 | TTCIThe Training Connection LLC (TTC-LLC) will exhibit at the SMTA Capital Expo on Thursday, May 14 at the DoubleTree by Hilton Baltimore - BWI Airport.