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Technica USA to Attend SEMICON West 2027, Expanding Presence in the Semiconductor Market

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Technica USA recently attended the SEMICON West Expo, where company representatives Jason Perry, President; Peter Chen, Equipment Service Manager; and Frank Medina focused on strengthening relationships with customers and supply partners while preparing for the company’s participation in SEMICON West 2027 that will take place March 30-April 1, in Phoenix, Arizona.

It’s Only Common Sense: Every Salesperson Must Become a Teacher

10/26/2026 | Dan Beaulieu -- Column: It's Only Common Sense
Customers do not need more sales pitches. They need more clarity.  They are trying to navigate material shortages, component constraints, changing tariffs, longer lead times, new technologies, geopolitical uncertainty, and the enormous demands AI is placing on the electronics supply chain. Every day brings another warning, and much of the information is contradictory, exaggerated, or so technical that it creates more confusion than understanding.

From IPC Standards to Practical DFM

10/21/2026 | Marcy LaRont, I-Connect007
DFM seems like common sense: If we know the rules a PCB must meet, why not check the design against them before it ever reaches the factory? In practice, of course, it’s not quite that simple. I caught up with Susan Kayesar, product manager at Siemens and longtime contributor to Global Electronics Association standards activities, to talk about an ongoing effort between Siemens and the Association to translate IPC requirements into practical, software-based DFM checks.

Building Consistent Reflow Results Across Automotive Manufacturing Sites

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Faster BGA Warpage Processing Without Shearing or Painting

10/21/2026 | Chris Gastaldo and Neil Hubble, Akrometrix
The process of measuring BGA samples for thermal warpage is subject to industry standards from both JEDEC, in JESD22-B112C and JEITA ED7306. Additionally, these standards establish allowable warpage values based on ball size and ball pitch, for the JEDEC standard, pass/fail further established in JEDEC SPP-024.3 Standard practice in these standards for measuring BGA warpage is to remove the solder balls in order to measure only the substrate surface. However, as both ball size and package thickness decrease, the practicality of removing solder balls without altering the sample shape has become increasingly challenging.
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