The Right Approach: The End of an Era—DoD Proposes MIL-PRF-31032 Cancellation
Defense Speak Interpreted: Hypersonics Report Back After Six Years of Silence
American Made Advocacy: American Microelectronics Power the Future of High Technology
Design for Test: A New Book from The Test Connection, Inc.
April 23, 2026 | Real Time with... APEX EXPOEstimated reading time: Less than a minute
Bert Horner, president of The Test Connection Inc., shares insights on designing for testability (DFT) challenges with Kelly Dack. Horner discusses the critical need for incorporating testability early in the design process and the importance of quantifiable metrics for measuring test coverage. He highlights The Test Connection's role in transferring decades of 'tribal knowledge' to emerging engineers through training and education. Look for "The Printed Circuit Assembler's Guide to... Design for Test, A Practical Guide to Test and Inspection" in the I-007eBooks library.
APEX EXPO 2026 has concluded successfully. If you couldn’t make it to the show, don’t worry, the I-Connect007 team has coverage of the entire week’s events. Watch your inbox on Fridays over the next several weeks for our complete coverage, delivered directly to your inbox, or visit Real Time with… APEX EXPO 2026 now for video interviews with the movers and shakers of the electronics industry.
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