Knocking Down the Bone Pile: Gold Mitigation for Class 2 Electronics
Punching Out: Your Financial Preparation for a Sale
Nolan's Notes: The Next Killer App in Component Manufacturing
JTAG Technologies Inside: The Future of Your ATE Application with Boundary-scan
October 23, 2015 | JTAG TechnologiesEstimated reading time: 1 minute
The access to nodes of assemblies with ever increasing complexity is more and more difficult and results in reduced fault coverage. Test engineers worry about this daily.
JTAG Technologies’ motto for this productronica year reads: Optimise your ATE with JTAG Technologies Inside — have a look at the possibilities that arise from the use of “JTAG TECHNOLOGIES INSIDE” and see your current test methods and possibilities from a different perspective. In our booth A1.458 at productronica we will display the following highlights from our comprehensive ATE product portfolio:
- ICT, MDA or flying probe systems are quickly and easily upgraded with JTAG Technologies’ boundary-scan solutions. Special add-on cards and software integration suites enable users to benefit from the features of the combined systems.
- Traditional functional tests based on National Instruments’ LabView/TestStand, C++, .net and other programming languages often feature complex and time-consuming test programs. Easy access to your assembly via boundary-scan pins can simplify your existing test programs and ease diagnosis in case of faults.
Peter van den Eijnden, managing director of JTAG Technologies commented this year’s focus for the show: “Since many years we are cooperating with renowned ATE suppliers to make sure that our customers will continue to enjoy optimal use of their existing ICT/MDA/FPT/FCT systems throughout the coming years. In joint efforts with various test system manufacturers we developed special hardware and software solutions. These special solutions enable perfect integration of our tools into these test systems, so users benefit from advantages of the combination of both methods”.
About JTAG Technologies
JTAG Technologies is a market leader and technology innovator of boundary-scan software and hardware products and services. The company was the first to bring to the market such important advances as automated test generation, automated fault coverage analysis, automated flash and PLD programming via boundary-scan, and visualized boundary-scan analysis. Its customers include world leaders in electronics design and manufacturing such as Ericsson, Flextronics, Honeywell, Medtronic, Motorola, Nokia, Philips, Raytheon, Rockwell-Collins, Samsung, and Sony. Its innovative boundary-scan products provide test preparation, test execution, test result analysis and in-system programming applications. With an installed base of over 8500 systems worldwide, JTAG Technologies serves the communications, medical electronics, avionics, defence, automotive, and consumer industries with offices throughout North America, Europe and Asia. JTAG Technologies headquarters are located in Eindhoven, The Netherlands.
Share on:
Suggested Items
Discover TRI Test Solutions at New-Tech 2025
05/08/2025 | TRIBynet Testing Systems, TRI's industry partner, will join New-Tech 2025 at EXPO Tel-Aviv, Pavilion 1 from May 20 – 21, 2025.
Datest Expands Presence in the Upper Midwest with Omni-Tec Partnership
05/05/2025 | DatestDatest, a trusted leader in advanced testing, engineering, inspection, and failure analysis services, is proud to announce its partnership with Gary Krieg of Omni-Tec, Inc. as its official sales representative in the Upper Midwest.
Northrop Grumman’s IVEWS Completes F-16 Electronic Warfare Operational Assessment
05/05/2025 | Northrop GrummanNorthrop Grumman Corporation’s IVEWS (Integrated Viper Electronic Warfare Suite) has successfully completed Operational Assessment flight testing on U.S. Air Force F-16 aircraft, demonstrating its effectiveness against advanced radar-guided threats.
Cadence Expands Design IP Portfolio Optimized for Intel 18A and Intel 18A-P Technologies, Advancing AI, HPC and Mobility Applications
05/01/2025 | Cadence Design SystemsCadence announced a significant expansion of its portfolio of design IP optimized for Intel 18A and Intel 18A-P technologies and certification of Cadence® digital and analog/custom design solutions for the latest Intel 18A process design kit (PDK).
The Knowledge Base: Unlocking the Invisible—The Critical Role of X-ray Technology
04/29/2025 | Mike Konrad -- Column: The Knowledge BaseFrom detecting voids under BGAs to solder defects in high-reliability applications, X-ray inspection has become an indispensable tool in modern manufacturing. But how is the technology evolving? What challenges do experts face in deploying X-ray inspection effectively and what does the future hold for this critical quality assurance method?