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The SMTA and the Center for Advanced Life Cycle Engineering (CALCE) announce the technical program for the Symposium on Counterfeit Parts and Materials this June 27-29, 2017 in College Park, Maryland.
The symposium will commence on Tuesday, June 27 with a keynote presentation by Thomas Sharpe, SMT Corporation, titled “Cloned Devices - How Similar or Different Are Those from Originals.” Sessions on standards and future technologies will feature presentations from Lansdale Semiconductor Inc., Northrop Grumman ES, and Battelle, among others.
Mark Snider, ERAI, will open the second day of the symposium with his keynote presentation “An Overview of Historical Trends Relating to Suspect Counterfeit, Non-Conforming and High Risk Electronic Components.” The subsequent sessions will focus on counterfeits lifecycle, detection related issues, current and future tool and views across the supply chain. Presentations are scheduled from companies including Rochester Electronics, Converge, GIDEP, Applied DNA Sciences, and more.
Thursday, June 29, is dedicated to two full-day workshops on (1) The Implementation Process of SAE 6171 and (2) Use of Component Documentation and Supply Chain for Counterfeit Avoidance.
The information presented at this symposium is valuable to quality and reliability managers, supply chain managers, brand protection specialists, inspectors, marketing and procurement policy makers, contracts and legal management, security specialists and government agencies.
About SMTA
The SMTA membership is an international network of professionals who build skills, share practical experience and develop solutions in electronic assembly technologies, including microsystems, emerging technologies, and related business operations.
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About CALCE
The Center for Advanced Life Cycle Engineering (CALCE), the largest electronic products and systems research center focused on electronics reliability, is dedicated to providing a knowledge and resource base to support the development of competitive electronic components, products and systems.
