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Current IssueThe Hole Truth: Via Integrity in an HDI World
From the drilled hole to registration across multiple sequential lamination cycles, to the quality of your copper plating, via reliability in an HDI world is becoming an ever-greater challenge. This month we look at “The Hole Truth,” from creating the “perfect” via to how you can assure via quality and reliability, the first time, every time.
In Pursuit of Perfection: Defect Reduction
For bare PCB board fabrication, defect reduction is a critical aspect of a company's bottom line profitability. In this issue, we examine how imaging, etching, and plating processes can provide information and insight into reducing defects and increasing yields.
Voices of the Industry
We take the pulse of the PCB industry by sharing insights from leading fabricators and suppliers in this month's issue. We've gathered their thoughts on the new U.S. administration, spending, the war in Ukraine, and their most pressing needs. It’s an eye-opening and enlightening look behind the curtain.
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Bowman's New XRF Measurement System Satisfies Need for Multi-Use Flexibility and Precision
October 10, 2023 | Bowman XRFEstimated reading time: 1 minute

Quality departments and contract shops that test many different plated parts need an XRF analyzer with an expansive measurement area, selectable spot sizes, and high levels of both precision - and speed.
Bowman's K Series benchtop XRF meets all of these requirements. It has a 12″x 12″ measurable area for parts up to 9″ tall. Selectable spot sizes accommodate a wide range of features; focal distances from .25″ to 3.5″.
A cantilever door design gives operators easy access; a servo motor-driven programmable stage streamlines sample positioning. Table-view functionality images the entire measurable area and allows the operator to navigate to any location with a single click.
The standard K Series configuration includes a 4-position multi-collimator. Variable focus simplifies measurements in recessed areas. Programs can use pattern matching and automatic focus for the most precise measurements.
As with all Bowman XRF systems, the K Series features a Silicon Drift Detector (SDD) and long-life micro focus X-ray tube.
Bowman’s K Series is a robust system built and backed by the technology leader in XRF analysis. It is ideally suited for the analysis of metals from aluminum through uranium (13-92 on the periodic table) and for the testing of printed circuit boards, wafers, connectors, electronic components and precious metals on jewelry, upscale hardware and other decorative objects.
The K Series is the 9th XRF in the Bowman benchtop portfolio. Like the other 8 systems, K Series instruments simultaneously measure up to 5 layers (base plus 4 plated layers), 10 elements in each layer.
To quantify plated thickness from the detected photons, K Series systems run Bowman’s Archer software. A unique Graphical User Interface makes this advanced, proven software easy to use, highly intuitive, and visually ergonomic. Archer generates customizable Excel reports with no MS Office required, and unlike competitive platforms, there is no need to install a software plug-in to export data to customer ERP systems.
Bowman customers are supported by a robust local service network that provides same-day response for every XRF requirement, worldwide. Equipment evaluation, selection, commissioning, maintenance and modernization is provided for users of all major XRF brands.
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