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CIMS to Showcase Advanced Inspection Solutions at KPCA 2024
August 23, 2024 | CIMSEstimated reading time: Less than a minute
CIMS, a leading provider of inspection solutions for the electronics manufacturing industry, will be exhibiting at the Korea Printed Circuit Association (KPCA) 2024 exhibition in Incheon from September 4-6.
At booth #510, CIMS will showcase its cutting-edge inspection solutions tailored for advanced IC substrates and turnkey software solutions for smart factories. Visitors can learn more about the latest CIMS products offered in partnership with AKC.
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CIMS to Showcase Advanced Solutions at TPCA 2024
10/17/2024 | CIMSCIMS, a leading provider of inspection solutions for the electronics manufacturing industry, will be exhibiting at the Taiwan Printed Circuit Association (TPCA) 2024 exhibition in Taipei from October 23-25.
CIMS to Showcase Advanced Solutions at TPCA 2024
09/30/2024 | CIMSCIMS, a leading provider of inspection solutions for the electronics manufacturing industry, will be exhibiting at the Taiwan Printed Circuit Association (TPCA) 2024 exhibition in Taipei from October 23-25.
CIMS Launches Capricorn, Next Generation AVI Solution
02/23/2022 | CIMSCIMS is launching its next generation AVI solution for IC Substrates based on a brand new platform – Capricorn.
PCB Manufacturer Ilfa Feinstleitertechnik Invests in New Electrical Test and AOI
09/16/2020 | ADEON TechnologiesTo keep on investing during the pandemic, ILFA Feinstleitertechnik GmbH, PCB manufacturer from Hannover Germany, invests in the latest technology from CIMS and atg-LM.
CIMS Galaxy: More Than an Inspection System
12/18/2019 | Pete Starkey, Real Time with...productronicaEditor Pete Starkey and Vladi discuss the newest CIMS AOI platform, Galaxy, which is more compact and more versatile than the previous Phoenix model. The Galaxy is scalable and can be equipped with more functions and connected to a variety of Industry 4.0 databases. Vladi explains that the Galaxy can be used for everything from inner layer inspection to final inspection, detecting defects down to 1 pixel. The system is available with multiple metrology options as well.