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Software Upgrade Expands Inspection Range
January 4, 2007 |Estimated reading time: Less than a minute
SANTA CLARA, Calif. For use with Medalist 5DX automated X-ray inspection (AXI) systems, Agilent's version 8.4 software includes new algorithms and an additional inspection threshold.
A specialized algorithm enables operators to inspect quad-flat no-lead (QFN) packages with a reported reduced rate of false call. Other algorithm updates are included for the paste program.
An additional threshold enables inspection along the side edges of a capacitor, evaluating solder presence. Previous generations allowed inspection at capacitor ends only. An updated open-slope paste test means that operators can perform defect characterization on non-wetted direct field-effect transistors (FETs).