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Dr. Jennie Hwang to Address "Tin Whisker – All You Should Know" in SMTA Webtorial Sessions
November 16, 2016 | Dr. Jennie HwangEstimated reading time: 2 minutes
Dr. Jennie Hwang, a long-standing leader in SMT manufacturing and lead-free implementation, will hold two 90-minute SMTA Webtorial Sessions to address tin whiskers. Dr. Hwang's presentation on "Tin Whisker – All You Should Know" will be held on December 7 and 8.
The webinar provides a working knowledge to all who are concerned with or interested in tin whisker and related issues in electronic packages and assemblies including designers, engineers, researchers, managers and business decision makers; also is designed for those who desire the broad-based information.
For the recent years, concerns about tin whiskers are intensifying although tin whisker and its potential mishaps have been recognized for more than six decades in electronic, electrical and industrial applications. The webtorial provides a holistic coverage on tin whisker from physical/phenomenal occurrence to fundamental scientific base to mitigating measures. The webtorial also explains why the tin whisker propensity under a study should be concluded with a specific alloy composition in conjunction with a specific system; and why a reference point is needed. Relative ranking of the tin whisker propensity among lead-free solder alloys in relation to SnPb alloy will be outlined.
Part 1:
- Definition & clarification
- Physical phenomena
- Reference point & criteria
- Causes and contributing factors
- Concerns & impact
- Reliability implications
Part 2:
- Test conditions
- Mitigation remedies - Relative effectiveness
- Plausible theory / mechanism
- Tin whisker vs. tin pest
- Summary
- Recommendations - prevention & mitigation
For more information and to register, click here.
About the Speaker:
Dr. Jennie Hwang brings deep knowledge to this webtorial through both hands-on and advisory experiences. She has provided solutions to many challenging problems, ranging from production yield to field failure diagnosis to reliability issues. Her work covers both commercial and military applications. She has 450+ publications to her credit, including the sole authorship of several internationally-used textbooks, and is a speaker at innumerable international and national events. Dr. Hwang has received many honors and awards. She has served on the Board of NYSE Fortune 500 companies, and on various civic, government and university boards and committees, including U.S. Defense Dept. - Globalization Committee, Forecasting Future Disruptive Technologies Committee. She chairs the Board of Panels on the Assessment of Army Research Laboratory, and on the National Materials and Manufacturing Board, National Laboratory Assessment Board and the Board of Army Science and Technology. She is a reviewer of various government programs and publications. Her formal education includes Harvard Business School Executive Program and four academic degrees in Metallurgical Engineering and Materials Science, Physical Chemistry, Organic Chemistry and liquid Crystal Science (Ph.D. M.S., M.S., B.S.). She has held various senior executive positions with Lockheed Martin Corp., SCM Corp, Sherwin Williams Co, and IEM Corp. She is also an invited distinguished adj. Professor of Engineering School of Case Western Reserve University, and serves on the University’s Board of Trustees.
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