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Altus Expands Offerings with Nikon Metrology’s X-Ray Inspection Systems
January 20, 2017 | Altus GroupEstimated reading time: Less than a minute

Altus Group Ltd has expanded its product offerings in the UK and Ireland with the addition of Nikon Metrology’s latest X-Ray Inspection systems.
The new relationship strengthens Altus' offerings of X-ray and CT inspection equipment, as the market for these processes grows. One solution available from Altus is Nikon Metrology's XT V 160, a high-precision, flat-panel based X-ray inspection system that facilitates real-time imaging and defect analysis of next-generation wafer-level, semiconductor device and PCBA applications.
Equipped with an in-house designed X-ray NanoFocus source and high precision manipulator, this inspection system offers unrivalled feature recognition compared to any product available on the market today.
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