-
- News
- Books
Featured Books
- smt007 Magazine
Latest Issues
Current IssueComing to Terms With AI
In this issue, we examine the profound effect artificial intelligence and machine learning are having on manufacturing and business processes. We follow technology, innovation, and money as automation becomes the new key indicator of growth in our industry.
Box Build
One trend is to add box build and final assembly to your product offering. In this issue, we explore the opportunities and risks of adding system assembly to your service portfolio.
IPC APEX EXPO 2024 Pre-show
This month’s issue devotes its pages to a comprehensive preview of the IPC APEX EXPO 2024 event. Whether your role is technical or business, if you're new-to-the-industry or seasoned veteran, you'll find value throughout this program.
- Articles
- Columns
Search Console
- Links
- Events
||| MENU - smt007 Magazine
ECT Launches Next Generation Probe for High Performance RF Signal Testing of PCBAs
May 19, 2017 | ECTEstimated reading time: 1 minute
Everett Charles Technologies (ECT) recently launched a high frequency test probe for the PCBA test market. The CSP-30ES-013 radio frequency probe mates to standard SMA connectors and combines proven RF performance with ease-of-use to ensure accurate and reliable testing. The CSP-30ES-013 coaxial probe provides an instrumentation-quality interface for broadband RF measurements in excess of 20 GHz, providing a cost-efficient solution for high volume board testing. With the addition of the CSP-30ES-013 high performance radio frequency probe, ECT expands its industry-proven high speed test interface portfolio.
The CSP-30ES-013 offers outstanding signal integrity and is capable of bandwidth measurements in excess of 20 GHz @ -1dB. With the CSP-30ES-013 RF probe, high frequency and functional tests can be performed in both high volume testing and engineering lab environments. Accurate small signal and RF power (50 Watts) measurements provide consistent and repeatable results. The CSP-30ES-013 ensures a consistent impedance of 50 Ohm.
The CSP-30ES-013 provides spring-loaded compliance for both the center signal probe and outer housing that provides ground contact. The articulated contact allows for targeting errors. The CSP-30ES-013 features a rugged design for inline applications and an easy to replace center conductor probe (SPL-30E-030). The knurl housing feature ensures easy and reliable press fit mounting.
Tony DeRosa, Senior Product Manager, confirms: “The CSP-30ES-013 probe meets the need for cost effective, high performance functional testing at high speed. Our engineers designed this probe to mate with SMA connectors and to provide excellent performance for our board test customers in both engineering characterization and high volume applications. It leverages Xcerra’s extensive knowledge in providing solutions for signal integrity sensitive applications, and we have over 15 years experience simulating complex test structures including probes, PCBA’s and launches. We build and test many structures to validate our products and corresponding models.”
Suggested Items
Real Time with… IPC APEX EXPO 2024: Circuit Board Testing Strategies and the Impact of AI
05/08/2024 |Editor Marcy LaRont speaks with Bert Horner, president of The Test Connection, about the importance of strategic planning and design-for-test (DFT). Bert touches on some common mistakes that occur when DFT is not adequately considered early on. The discussion outlines an overarching industry need for a culture shift toward increasingly higher levels of integration and collaboration. Bert mentions that AI now has an influence on testing, as everywhere else, and announces his forthcoming book.
Real Time with… IPC APEX EXPO 2024: Understanding Objective Evidence in Manufacturing Processes
05/07/2024 | Real Time with...IPC APEX EXPOGraham Naisbitt explains the importance of objective evidence in manufacturing processes, debunking the common misconception that the ROSE test is a cleanliness test. He also discusses the introduction of Rev J, a requirement for measuring ionic contamination on circuit assemblies, and the challenges in accurately measuring contamination. Alternative methods like ion chromatography and the need for updating standards like the ROSE test are mentioned.
U.S. Air Force Secretary Kendall Flies in AI-Piloted X-62A VISTA
05/06/2024 | Lockheed MartinLockheed Martin Skunk Works joined the U.S. Air Force Test Pilot School and other government and industry partners in hosting U.S. Secretary of the Air Force Frank Kendall to fly in the X-62A Variable In-flight Simulation Test Aircraft (VISTA), a one-of-a-kind aircraft modified to test artificial intelligence (AI) and autonomy capabilities.
Real Time with… IPC APEX EXPO 2024: Software Solutions for Circuit Board Challenges
05/03/2024 | Real Time with...IPC APEX EXPONolan Johnson speaks with Will Webb from Aster Technologies about their software solutions for design teams, manufacturing, test engineers, and process engineers. Aster's software addresses the increasing complexities of circuit boards and the need for alternative testing methods.
Manta Ray UUV Prototype Completes In-Water Testing
05/02/2024 | DARPAThe Manta Ray prototype uncrewed underwater vehicle (UUV) built by performer Northrop Grumman completed full-scale, in-water testing off the coast of Southern California in February and March 2024.