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TRI to Participate on Fuji's ELF Standard for M2M in SMT Assembly
March 9, 2018 | Test Research Inc.Estimated reading time: 1 minute
Test and inspection systems provider Test Research Inc. (TRI) is participating in Fuji’s ELF Standard for M2M in SMT Assembly. TRI believes that Industry 4.0 will revolutionize how the SMT Industry operates by being able to interconnect different machines from different vendors providing and optimizing their production lines.
The ELF standard is reshaping the SMT assembly industry by providing a lean production and manufacturing with faster turnarounds in production levels, thus increasing its participant’s competitiveness. The ELF standard aims to minimize resistance to facilitate it. By the cooperating with SMT assembly innovators, Industry 4.0 trend will significantly benefit from standards that the participating vendors can follow.
Sharing the same values and goals of Fuji’s standard, TRI will join other industry pioneers such as Panasonic, Yamaha and CKD Corporation. TRI follows the same principles of manufacturability consideration design (DFM) and environmentally-friendly design (DFE) by providing high-quality assurance inspection to the SMT assembly industry.
About TRI
TRI offers the most robust product portfolio in the industry for Automatic Test and Inspection solutions. From Solder Paste Inspection (SPI), Automated Optical Inspection (AOI), and 3D Automated X-ray Inspection (AXI) systems to Manufacturing Defect Analyzers (MDAs) and In-Circuit Test equipment, TRI provides the most cost-effective solutions to meet a comprehensive range of manufacturing Test and Inspection requirements. Learn more at www.tri.com.tw.
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Book Excerpt: The Printed Circuit Assembler’s Guide to... Low-Temperature Soldering, Vol. 2, Chapter 4
10/03/2024 |Chapter 4 of this book addresses the challenges in ensuring high electrical reliability of low-temperature solder pastes in modern electronic assembly. Also covered is the need for new-generation materials due to advancements in technology. The authors also explore the impact of flux components on electrical reliability and the formulation considerations to achieve higher reliability.