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Current IssueIPC APEX EXPO 2025: A Preview
It’s that time again. If you’re going to Anaheim for IPC APEX EXPO 2025, we’ll see you there. In the meantime, consider this issue of SMT007 Magazine to be your golden ticket to planning the show.
Technical Resources
Key industry organizations–all with knowledge sharing as a part of their mission–share their technical repositories in this issue of SMT007 Magazine. Where can you find information critical to your work? Odds are, right here.
The Path Ahead
What are you paying the most attention to as we enter 2025? Find out what we learned when we asked that question. Join us as we explore five main themes in the new year.
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Discover TRI's PCB Inspection Solutions at SMTA Queretaro 2018
June 20, 2018 | Test Research Inc.Estimated reading time: Less than a minute
Test Research Inc. (TRI) will take part in SMTA Queretaro Table Top Exhibition and Tech Forum. The exhibition will be held in Hotel Mision Juriquilla, Qro., Mexico on July 12, 2018. Visit TRI's exhibit and discover the World-class Test and Inspection for the PCB Assembly Industry.
TRI's VP of Sales and Marketing Jim Lin commented on the occasion, "We are eager to share TRI's Innovative Inspection Solutions for the rising SMT industry in Mexico."
Join us at SMTA Queretaro to share our insight on PCB Inspection and Testing. TRI offers One Stop Solution for PCB Inspection: 3D Solder Paste Inspection (SPI), 3D Automated Optical Inspection (AOI), 3D CT Automated X-ray Inspection (AXI), High Performance In-Circuit Testing (ICT) and Functional Tester (FCT). Our experts will reveal the advantages TRI's high performance hardware design can bring to your production. TRI's systems are designed to interoperate with other manufacturing equipment to minimize downtime, optimize production quality and reduce operator workload.
About TRI
TRI provides the most cost-effective solutions to meet comprehensive range of manufacturing Test and Inspection requirements, from Automatic Test and Inspection solutions to Manufacturing Defect Analyzers, In-Circuit Tester and Functional Tester. Learn more here.
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