-
- News
- Books
Featured Books
- smt007 Magazine
Latest Issues
Current IssueWhat's Your Sweet Spot?
Are you in a niche that’s growing or shrinking? Is it time to reassess and refocus? We spotlight companies thriving by redefining or reinforcing their niche. What are their insights?
Moving Forward With Confidence
In this issue, we focus on sales and quoting, workforce training, new IPC leadership in the U.S. and Canada, the effects of tariffs, CFX standards, and much more—all designed to provide perspective as you move through the cloud bank of today's shifting economic market.
Intelligent Test and Inspection
Are you ready to explore the cutting-edge advancements shaping the electronics manufacturing industry? The May 2025 issue of SMT007 Magazine is packed with insights, innovations, and expert perspectives that you won’t want to miss.
- Articles
- Columns
- Links
- Media kit
||| MENU - smt007 Magazine
Siborg Offers New Bluetooth Data Acquisition Tool for Surface Mount Technology
September 28, 2020 | PR NewswireEstimated reading time: 2 minutes

A new model of the LCR-Reader-MPA offers Bluetooth connection enabling remote test data recording. The main feature of the tool is its’ LCR-MPA-BT Logger program that allows users to set specific test parameters for each component in the predefined list and then to automatically grant Pass/Fail status to the tested component.
LCR-Reader-MPA is the newest model in the LCR-Reader line of digital multimeters; this model features a 0.1% basic accuracy and wide range of features including 100 kHz test signal level, oscilloscope, AC/DC current measurement, easy open/short testing, and super cap testing to 1,000 mF. When the gold-plated tweezer probes are in contact with a component, either loose or mounted, the MPA will automatically determine the type of component and best test parameters. It will then test the component with 0.1% basic accuracy and display all measured values and test settings on the display. LCR-Reader-MPA BT offers all the same functions and features as MPA while also offering Bluetooth connectivity.
The ability to test components with virtually no set-up makes component sorting much faster, but it becomes order of magnitude more efficient with the ability to automatically grant pass/fail status and record the test results into a spreadsheet. The automatic recording is the most useful for time-sensitive tasks, such as production lines and quality control. All measurement values can be exported to an Excel file for later analysis.
To use the LCR-MPA-BT Logger program, simply connect the BT dongle to PC, turn on the MPA and only then start the program and click Connect button to establish the connection. The program will show that the device is connected and is ready to make testing. The main display shows what is shown on the devices’ display: main impedance value, secondary value, signal test level, test frequency level, and equivalent circuit. This main section also allows users to change these basic test parameters right from the program; when they are clicked, a small pop-out menu shows the various settings for that parameter and enables editing.
The main feature of the program is the Pass/Fail assessment feature. Users can set custom profiles for each component in a predefined list (such as BOM); set the desired values for impedance values and test settings (frequency, signal level and circuit model) and measure components. The main display of the screen will turn red if the component does not meet the desired specifications. The values are also recorded into the rows below the main display, with the “Test” column turning red or green depending on the outcome. This is an invaluable feature for quickly sorting components for various tasks. Users can see if the component is a pass or fail with just a glimpse.
The Logger program allows for testing single components or multiple components. Single Component testing is best for testing the same type of component repeatedly. Simply set the desired values and test, pressing the space bar for each measurement to record.
The Multiple Component testing allows users to set various types of components with different desired values. This is best for setting a range of components for a full PCB. Users can name and set different values for Capacitors, Inductors and Resistors and measure accordingly by selecting the desired component from the list. Instead of recording a list of values like the Single Component testing, Multiple Component testing overrides the last measurement in the same row.
Suggested Items
Magnalytix and Foresite to Host Technical Webinar on SIR Testing and Functional Reliability
06/26/2025 | MAGNALYTIXMagnalytix, in collaboration with Foresite Inc., is pleased to announce an upcoming one-hour Webinar Workshop titled “Comparing SIR IPC B-52 to Umpire 41 Functional & SIR Test Method.” This session will be held on July 24, 2025, and is open to professionals in electronics manufacturing, reliability engineering, and process development seeking insights into new testing standards for climatic reliability.
Defense Speak Interpreted: Is DARPA Still Around After CHIPS?
06/24/2025 | Dennis Fritz -- Column: Defense Speak InterpretedWhen I first published my Defense Speaks Interpreted column in January 2019 on the Defense Advanced Research Projects Agency (DARPA ERI), the agency advocated for an expanded Defense emphasis on closing the growing technology gap in microelectronics. The emphasis was on “resurgence.”
I-Connect007 Editor’s Choice: Five Must-Reads for the Week
06/13/2025 | Marcy LaRont, I-Connect007Today is Friday the 13th, and in much of Western folklore, this is a day when bad luck is lurking. But while Friday the 13th may top Western superstition charts, the global calendar is sprinkled with its own unlucky legends. In Spain and Greece, the bad juju lands on Tuesday the 13th—a day linked to Mars, the god of war, and naturally, chaos. In Italy, it’s Friday the 17th that is feared, thanks to the Roman numeral XVII, which can be rearranged to spell VIXI—Latin for “I have lived” (a poetic way of saying you’re dead).
TTCI Celebrates Melanie Rutkauskas’ 10-Year Anniversary and Her Leadership of New Training Division
06/12/2025 | TTCIThe Test Connection Inc. (TTCI), a leading provider of electronic test and manufacturing solutions, is proud to celebrate Melanie Rutkauskas on her 10-year anniversary with the company.
Bridging the Knowledge Gap in Test: A Conversation with Bert Horner
06/11/2025 | Barry Matties, I-Connect007Bert Horner is a seasoned industry veteran and co-creator of The Test Connection, Inc. (TTCI), a test and inspection company spanning over 45 years. In this candid conversation, Bert reflects on the challenges our industry faces with the retirement of career professionals and the subsequent loss of critical tribal knowledge. As he unveils The Training Connection’s innovative training initiatives, Bert emphasizes the importance of evolving educational programs that align with industry needs, particularly in design for test (DFT), and sheds light on strategies being implemented to foster the next generation of engineers.