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The Knowledge Base: Building the Workforce of Tomorrow With EMAC
Gen3 Provides Key Tools for Electric Vehicles
March 23, 2022 | Gen3Estimated reading time: 1 minute
UK Manufacturer of test and measurement equipment for the electronics industry, Gen3 is working overtime to produce enough of its systems to meet the rapidly growing demand for both their AutoSIR2+ and AutoCAF2+ Systems.
The explosion in electric vehicles has seen massive increases in the electronic drive train that has put significant stresses on circuit boards. Failure by CAF and other high voltage mechanisms are now of key concern. The AutoCAF is the perfect instrument to characterise and provide objective evidence validating key electronic material choices.
Gen3 have been globally testing and measuring the electronics industry for over 40 years. With a reputation for precision in excellence, they have become the ‘go-to’ company for all sizes of Original Electronic Makers (OEMs) to ensure perfection in performance and reliability.
Customer demand for their AutoCAF2+ system has seen a year’s worth of orders placed over a 4-month period, and this is only to increase as the year progresses. Our newly expanding team have been successful in meeting this sudden upsurge in demand.
Andy Naisbitt, CEO of Gen3 commented “We continue to work alongside our customers in ensuring their products meet the standards that the industry sets. We are pleased that our system is selected and have been acknowledged as the ‘go to’ system Worldwide.”
CAF, or sub-surface electro-chemical migration, is a serious challenge in the development and design of printed circuit boards especially in the newly evolving e-mobility market. Early detection of possible CAF formation during the development of printed circuit boards can minimize safety risks and reduce the cost of failures in service.
CAF testing for Electric Vehicle technology is now running at up to 4000V for over 4000 hours.
- The Printed Circuit Assembler’s Guide to… Process Validation by Graham K. Naisbitt (a free eBook available for download)
- “Predicting Reliability in Electronics,” a free 12-part webinar series with experts Graham Naisbitt and Chris Hunt
- Roundtable Discussion: Process Ionic Contamination Test (PCT) Standard Roundtable with Industry Experts, including Graham Naisbitt of Gen3, Teresa Rowe of IPC, Jason Keeping of Celestica, and Doug Pauls of Collins Aerospace
- You can also view other titles in our full I-007e Book library here.
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