-
-
News
News Highlights
- Books
Featured Books
- smt007 Magazine
Latest Issues
Current IssueSpotlight on India
We invite you on a virtual tour of India’s thriving ecosystem, guided by the Global Electronics Association’s India office staff, who share their insights into the region’s growth and opportunities.
Supply Chain Strategies
A successful brand is built on strong customer relationships—anchored by a well-orchestrated supply chain at its core. This month, we look at how managing your supply chain directly influences customer perception.
What's Your Sweet Spot?
Are you in a niche that’s growing or shrinking? Is it time to reassess and refocus? We spotlight companies thriving by redefining or reinforcing their niche. What are their insights?
- Articles
- Columns
- Links
- Media kit
||| MENU - smt007 Magazine
Gen3’s Dr. Chris Hunt to Present at SMTA Electronics in Harsh Environments Conference
May 5, 2022 | Gen3Estimated reading time: 1 minute

Gen3, a British manufacturer of testing and measuring the electronics industry, announced that Dr Chris Hunt, CTO, will present during the SMTA Electronics in Harsh Environments Conference. The presentation, “Objective Evidence and How to Convince the Auditors,” will take place on Wednesday, May 18, 2022, from 16:30 – 17:00 p.m. at the Park Plaza Victoria Amsterdam.
Gen3’s Dr. Chris Hunt will be addressing the question that everyone is facing in the industry globally, what does ”Objective Evidence “mean/require?
- This will be a measurement system that will be repeatable and reproducible, and that can have a metric that directly relates to performance.
- For ECM a suitable metric is resistance.
- ECM produces corrosion products and ionic current flows that contribute to unwanted circuit elements.
- A measurement of the isolation resistance between circuit features therefore provides a direct circuit performance metric.
- SIR and CAF are examples of techniques that measure resistance, and hence provide Objective Evidence .
SIR, for process validation testing, was first established more than 30 years ago. It was a spin-off from the British CFC Elimination Project led by Dr Colin Lea OBE, at the British National Physical Laboratory. With the then advent of no-clean fluxes, it was the only test method to determine electro-chemical reliability and hence acceptable cleanliness as used at that time.
It was recognised as unsuitable for process control and that process ionic contamination testing (PICT) should be maintained for fast and effective control within 15 minutes.
New test methods have been introduced by IEC in the past 2 years:
- IEC 61189-5-502 – Surface Insulation Resistance (SIR) testing of assemblies - 2021
- IEC 61189-5-504 – Process Ionic Contamination Testing (PICT) - 2020
Gen3’s presentation will also look at the other test methods and compare their pro’s and con’s, including Ion Chromatography, FTIR, SEM + EDAX and new Digital Microscopy.
- The Printed Circuit Assembler’s Guide to… Process Validation by Graham K. Naisbitt
- “Predicting Reliability in Electronics,” a free 12-part webinar series with experts Graham Naisbitt and Chris Hunt
- Roundtable Discussion: Process Ionic Contamination Test (PCT) Standard Roundtable with Industry Experts, including Graham Naisbitt of GEN3, Teresa Rowe of IPC, Jason Keeping of Celestica, and Doug Pauls of Collins Aerospace
- You can also view other titles in our full I-007e book library here.
Testimonial
"We’re proud to call I-Connect007 a trusted partner. Their innovative approach and industry insight made our podcast collaboration a success by connecting us with the right audience and delivering real results."
Julia McCaffrey - NCAB GroupSuggested Items
TTCI and The Training Connection Strengthen Electronics Manufacturing with Test Services and Training at PCB West 2025
09/16/2025 | The Test Connection Inc.The Test Connection Inc. (TTCI), a trusted provider of electronic test and manufacturing solutions, and The Training Connection LLC (TTC-LLC) will exhibit at PCB West 2025, taking place Wednesday, October 1, 2025, at the Santa Clara Convention Center in California. Visitors are invited to Booth 113 to explore the companies’ complementary expertise in test engineering services and workforce development for the electronics industry.
Smart Eye Receives Milestone AIS Order from Fleet Safety Company Optix
09/11/2025 | Smart EyeSmart Eye, a global leader in Human Insight AI and Driver Monitoring Systems (DMS), announced a milestone order for its AIS system from Optix, a global provider of fleet management solutions. Initially, in 2025, 4,000 commercial vehicles will be equipped with Smart Eye’s technology, marking the first wave of deployments globally.
Datest Unveils Viscom iX7059 XL 3D CT AXI System
08/25/2025 | DatestDatest, a trusted leader in advanced testing, engineering, inspection, and failure analysis services, and the go-to destination for when your boards misbehave and your AXI line goes on vacation, is thrilled to announce the arrival of its newest diagnostic weapon: the Viscom iX7059 XL 3D CT AXI Inspection System.
Gardien Services Installs Customized G93 Flying Probe Tester – Largest Test Area in North America/Europe
09/07/2025 | Gardien GroupGardien Group is proud to announce the successful installation of a customized G93 Flying Probe Test Machine at a major manufacturer in North America. This cutting-edge system features the largest test area of any flying probe tester in North America and Europe, setting a new benchmark for PCB testing capabilities.
Meet with The Test Connection Inc. (TTCI) at SMTA Guadalajara 2025
08/18/2025 | The Test Connection Inc.The Test Connection Inc. (TTCI), a trusted provider of electronic test and manufacturing solutions for more than 45 years, is pleased to announce its participation at the upcoming SMTA Guadalajara Expo & Tech Forum, taking place September 17–18, 2025, at Expo Guadalajara, Salón Jalisco Hall D & E.