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Latest I-007eBook from GEN3 Focuses on Process Control
May 25, 2023 | I-Connect007Estimated reading time: Less than a minute
I-007eBooks is pleased to announce the release of the latest book in its The Printed Circuit Assembler’s Guide to…™ series.
The Printed Circuit Assembler's Guide to...™ Process Control, brought to you by GEN3 Systems and I-007eBooks, tackles critical aspects related to process control and the role of the SEC test in maintaining and providing objective evidence.
Written by GEN3 topic experts Dr. Chris Hunt and Graham Naisbitt, this book covers everything from 'open' and 'closed' loop circulation, corrosion prevention and ECM avoidance, to SIR tests for process verification, equipment and solution choices, and more. Readers will gain valuable insight into optimizing their assembly operations.
According to peer reviewer Mike Cummings: “This book is not based on fear marketing, but rather is an honest appraisal of a difficult decision companies have to make toward their product service life, based on the product field data and established and proven test processes.”
Download your free copy today here, as well as the first book in this two-part series, The Printed Circuit Assembler’s Guide to…™ Process Validation.
We hope you enjoy The Printed Circuit Assembler’s Guide to… Process Control. View our full library at I-007eBooks.com.
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05/08/2024 |Editor Marcy LaRont and President of The Test Connection, Bert Horner, discuss the importance of strategic planning and design-for-test (DFT) and touch on some of the common mistakes that occur when DFT is not adequately considered early on. The discussion outlines an overarching industry need for a culture shift towards increasingly higher levels of integration and collaboration. Bert mentions that AI now has an influence on testing, as everywhere else, and announces his forthcoming book which will be available soon.
Real Time with… IPC APEX EXPO 2024: Understanding Objective Evidence in Manufacturing Processes
05/07/2024 | Real Time with...IPC APEX EXPOGraham Naisbitt explains the importance of objective evidence in manufacturing processes, debunking the common misconception that the ROSE test is a cleanliness test. He also discusses the introduction of Rev J, a requirement for measuring ionic contamination on circuit assemblies, and the challenges in accurately measuring contamination. Alternative methods like ion chromatography and the need for updating standards like the ROSE test are mentioned.
U.S. Air Force Secretary Kendall Flies in AI-Piloted X-62A VISTA
05/06/2024 | Lockheed MartinLockheed Martin Skunk Works joined the U.S. Air Force Test Pilot School and other government and industry partners in hosting U.S. Secretary of the Air Force Frank Kendall to fly in the X-62A Variable In-flight Simulation Test Aircraft (VISTA), a one-of-a-kind aircraft modified to test artificial intelligence (AI) and autonomy capabilities.
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