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Seica Releases New Video for Pilot VX
March 4, 2024 | SeicaEstimated reading time: 1 minute

Seica unveils the latest video showcasing the capabilities of the PILOT VX, setting the gold standard for flying probe speed and performance. With cutting-edge technology and precision engineering, the PILOT VX redefines the benchmarks of efficiency and accuracy in the realm of flying probe testing. This innovative system delivers unmatched speed and reliability, ensuring rapid and thorough testing of electronic components.
More about Pilot VX
The PILOT VX test platform, is the new gold standard in terms of flying probe speed and performance. New, state-of-the-art mechanical architecture and motion controllers enable a reduction of up to 50% in test time, 12 multi-function test heads provide the capability for double-side probing of up to 44 points simultaneously and technologically advanced measurement hardware and a new microwave-based measurement technique provide unrivaled test performance. Optimized VIVA software management saves even more time by enabling the parallelization of different types of tests, and smart analysis capabilities together, with algorithms based on the principles of artificial intelligence can automatically optimize the test flow in run-time, while maintaining test coverage targets. The FlyPod option extends testing capability even more by specializing a single mobile probe to carry up to 14 channels, enabling access to boundary scan circuits and adding onboard programming capability without any external fixed cables and the Pilot VX platform includes options for testing flex circuits and the electrical and optical test of LEDs. In addition, the Pilot VX can also generate pressure/force topology maps of the device under test using the innovative FlyStrain™ option. Once a necessity for traditional fixture-based solutions, Seica has migrated these new tools to the flying prober where testing of ceramics, wafers and avionics and satellite boards requires delicate probing and traceability.
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Rachael Temple - AlltematedSuggested Items
Meet with The Test Connection Inc. (TTCI) at SMTA Guadalajara 2025
08/18/2025 | The Test Connection Inc.The Test Connection Inc. (TTCI), a trusted provider of electronic test and manufacturing solutions for more than 45 years, is pleased to announce its participation at the upcoming SMTA Guadalajara Expo & Tech Forum, taking place September 17–18, 2025, at Expo Guadalajara, Salón Jalisco Hall D & E.
MoU to Revolutionize Photonic Integrated Circuit (PIC) Device Testing with AI-Driven Solutions
08/07/2025 | PRNewswireLightium AG, MPI Corporation, and Axiomatic_AI Inc. have entered into a Memorandum of Understanding (MoU) to jointly develop the world's first Intelligent, Autonomous, and Integrated Test Solution (IAITS) for photonic devices.
InTest Receives $2.6 Million Defense Industry Order
08/06/2025 | BUSINESS WIREInTest Corporation, a global supplier of innovative test and process technology solutions for use in manufacturing and testing in key target markets which include semiconductor (semi), automotive/EV, defense/aerospace, industrial, life sciences, and safety/security, announced that it was awarded a $2.6 million order by a prime defense contractor.
Circuit Check Acquires Solution Sources Programming (SSP) to Become a Full-Service Test and Programming Provider with Expanded Presence in Silicon Valley
08/05/2025 | PR NewswireCircuit Check, a global leader in turnkey functional test systems across medical, automotive, industrial, military/aerospace, and emerging AI applications, today announced the acquisition of Solution Sources Programming (SSP), a trusted Silicon Valley provider of integrated test and programming solutions for over 35 years.
Register Now for the HATS²™ Technical Day at GEN3 HQ
08/05/2025 | GEN3GEN3 a world-leading manufacturer of testing, measurement and production solutions for electronics reliability. Headquartered in Farnborough, UK, GEN3 is announcing the final call for registrations to attend the exclusive HATS²™ Technical Day — a hands-on, live demonstration event showcasing the Highly Accelerated Thermal Shock Tester (HATS²™), the groundbreaking innovation from industry pioneer Bob Neves.